Datasheet Texas Instruments OPA551UA/2K5G4

ManufacturerTexas Instruments
SeriesOPA551
Part NumberOPA551UA/2K5G4
Datasheet Texas Instruments OPA551UA/2K5G4

High-Voltage, High-Current Operational Amplifiers 8-SOIC -40 to 125

Datasheets

OPA55x High-Voltage, High-Current Operational Amplifiers datasheet
PDF, 1.2 Mb, Revision: B, File published: Jan 7, 2016
Extract from the document

Prices

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Packaging

Pin8
Package TypeD
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Width (mm)3.91
Length (mm)4.9
Thickness (mm)1.58
Pitch (mm)1.27
Max Height (mm)1.75
Mechanical DataDownload

Parametrics

Additional FeaturesN/A
Approx. Price (US$)1.90 | 1ku
ArchitectureFET
CMRR(Min)(dB)92
CMRR(Typ)(dB)102
GBW(Typ)(MHz)3
Input Bias Current(Max)(pA)100
Iq per channel(Max)(mA)8.5
Iq per channel(Typ)(mA)7
Number of Channels(#)1
Offset Drift(Typ)(uV/C)7
Operating Temperature Range(C)-40 to 125
Output Current(Typ)(mA)380
Package GroupSOIC
Package Size: mm2:W x L (PKG)See datasheet (PDIP)
Rail-to-RailNo
RatingCatalog
Slew Rate(Typ)(V/us)15
Total Supply Voltage(Max)(+5V=5, +/-5V=10)60
Total Supply Voltage(Min)(+5V=5, +/-5V=10)8
Vos (Offset Voltage @ 25C)(Max)(mV)3

Eco Plan

RoHSNot Compliant
Pb FreeNo

Design Kits & Evaluation Modules

  • Evaluation Modules & Boards: OPAMPEVM
    Universal Operational Amplifier Evaluation Module
    Lifecycle Status: Active (Recommended for new designs)

Application Notes

  • Optoelectronics Circuit Collection
    PDF, 261 Kb, File published: Jun 11, 2001
    This application report presents a collection of analog circuits that may be useful in electro-optic applications such as optical networking. The circuits are Avalanche Photodiode Bias Supply 1; Linear TEC Driver-1, -2, and -3; Laser Diode Driver-1 and -2; and Temperature Under- and Over-range Sensing with a Window Comparator.
  • MTTF, Failrate, Reliability, and Life Testing
    PDF, 51 Kb, File published: Oct 4, 2000
    At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr

Model Line

Manufacturer's Classification

  • Semiconductors > Amplifiers > Operational Amplifiers (Op Amps) > Power Op Amps
EMS supplier