John Fattaruso

John Fattaruso

John Fattaruso

John W. Fattaruso grew up in Berkeley, CA, and received the B.S (highest honors), M.S., and Ph.D. degrees in electrical engineering from the University of California, Berkeley, in 1978, 1982 and 1986, respectively.,He has been a Hertz Foundation Fellow, Teaching Associate, Research Assistant and Instructor at the University of California, Berkeley. In 1979 he worked in the Digital Signal Processing R&D group at Hewlett-Packard, Santa Clara, CA, and in 1985 he served as a consultant to Seeq Technology, San Jose, CA. From 1987 to 2009 he was an analog VLSI circuit and device designer in a wide range of research and product development departments of Texas Instruments, Dallas, TX. He was elected Distinguished Member of the Technical Staff of Texas Instruments in 2001. Since 2011 he has served as an Adjunct Professor at Southern Methodist University, Dallas, TX, in both the electrical engineering and physics departments.

He currently holds 32 patents in circuit design and has authored or co-authored 24 journal papers and conference presentations. He has served on the analog circuit patent committee of Texas Instruments, the analog program subcommittee of the ISSCC, as an invited author of an analog design tutorial and short course at the ISSCC, and as guest editor of the JSSC. His technical interests include analog and RF circuit design, circuit simulation and optimization, numerical analysis and computational physics.,Dr. Fattaruso is a member of Eta Kappa Nu, Tau Beta Pi and Phi Beta Kappa. He is the recipient of service awards for the Analog Program Subcommittee of the ISSCC and the Dallas Chapter of the IEEE SSCS.

Areas of interest of the author: Measurement

Publications on RadioLocman by the author John Fattaruso:

  1. Measure inductance & capacitance over a wide range
    Most simple circuits you'll find for measuring reactive components cover only a limited range of component values. Here's a circuit built from a handful of inexpensive parts that will let you measure values of both capacitors and inductors over seven orders of magnitude....
    20-09-2021
  2. Simple circuit lets you characterize JFETs
    Measure the pinch-off voltage VP and zero-bias drain current IDSS to select matched pairs of JFETs When working with discrete JFETs, designers may need to accommodate a large variation in device parameters for a given transistor type. A square-law equation is usually used as...
    10-03-2013