Datasheet Texas Instruments DAC38RF85IAAV

ManufacturerTexas Instruments
SeriesDAC38RF85
Part NumberDAC38RF85IAAV
Datasheet Texas Instruments DAC38RF85IAAV

14-Bit, 9-GSPS, 6x-24x Interpolating, 6 & 9 GHz PLL Digital-to-Analog Converter (DAC) 144-FCBGA -40 to 85

Datasheets

DAC38RFxx Dual- or Single-Channel, Single-Ended or Differential Output, 14-Bit, 9-GSPS, RF-Sampling DAC With JESD204B Interface and On-Chip PLL datasheet
PDF, 3.7 Mb, Revision: C, File published: Jul 31, 2017
Extract from the document

Prices

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityYes

Packaging

Pin144
Package TypeAAV
Industry STD TermFCBGA
JEDEC CodeS-PBGA-N
Package QTY168
CarrierJEDEC TRAY (10+1)
Device MarkingDAC38RF85I
Width (mm)10
Length (mm)10
Thickness (mm)1.45
Pitch (mm).8
Max Height (mm)1.94
Mechanical DataDownload

Parametrics

ArchitectureCurrent Source
DAC Channels1
InterfaceJESD204B
Interpolation6x,8x,10x,12x,16x,18x,20x,24x
Operating Temperature Range-40 to 85 C
Package GroupFCBGA
Package Size: mm2:W x LSee datasheet (FCBGA) PKG
Power Consumption(Typ)2195 mW
RatingCatalog
Resolution14 Bits
SFDR72 dB
Sample / Update Rate9000 MSPS

Eco Plan

RoHSCompliant

Design Kits & Evaluation Modules

  • Evaluation Modules & Boards: DAC38RF82EVM
    DAC38RF82 Dual-Channel, 14-Bit, 9-GSPS, 1x-24x Interpolating, 6 & 9 GHz PLL DAC Evaluation Module
    Lifecycle Status: Active (Recommended for new designs)

Application Notes

  • DAC38RF8x Test Modes
    PDF, 3.0 Mb, File published: Jul 25, 2017
    The DAC38RF8x family of devices comes equipped with multiple test modes to assist users in verifying systems in rapid prototyping situations. This application report covers two of the available tests, the pseudorandom binary-sequence test and JESD204B short pattern test, in detail using the TI DAC38RF8xEVM and TSW14J56EVM capture card.
  • Quick-Start Methods in Simulating the DAC38RF8x Input/Output Buffer Information
    PDF, 600 Kb, File published: Aug 2, 2017
    Input/output Buffer Information Specification (IBIS) models are used to simulate digital electrical interfaces.These models can be categorized into two main categories: traditional and algorithmic modeling interface(AMI). AMI is typically used for SerDes channel simulation, and is different from the traditional IBIS model,which is the focus of this document. These models are simple ASCII tex
  • Eye Scan Testing with the DAC38RFxx
    PDF, 3.6 Mb, File published: Aug 10, 2017
    The DAC38RFxx family of devices comes equipped with the capability to generate eye diagrams by usinging JTAG communication with the DAC38RF8x eye scan GUI software. By running this software, users can generate eye diagrams to compare with the JESD204B standard eye mask requirements, and verify signal integrity performance of the SerDes link between DAC and FPGA/ASIC. This application report descri

Model Line

Series: DAC38RF85 (2)

Manufacturer's Classification

  • Semiconductors > Data Converters > Digital-to-Analog Converters (DACs) > High Speed DACs (>10MSPS)