Datasheet Texas Instruments SNJ54BCT8374AFK

ManufacturerTexas Instruments
SeriesSN54BCT8374A
Part NumberSNJ54BCT8374AFK
Datasheet Texas Instruments SNJ54BCT8374AFK

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

Datasheets

Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops datasheet
PDF, 435 Kb, Revision: E, File published: Jul 1, 1996
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Prices

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Packaging

Pin28282828
Package TypeFKFKFKFK
Industry STD TermLCCCLCCCLCCCLCCC
JEDEC CodeS-CQCC-NS-CQCC-NS-CQCC-NS-CQCC-N
Package QTY1111
CarrierTUBETUBETUBETUBE
Device Marking5962-8374AFK9172701Q3ASNJ54BCT
Width (mm)11.4311.4311.4311.43
Length (mm)11.4311.4311.4311.43
Thickness (mm)1.831.831.831.83
Pitch (mm)1.271.271.271.27
Max Height (mm)2.032.032.032.03
Mechanical DataDownloadDownloadDownloadDownload

Eco Plan

RoHSSee ti.com

Model Line

Manufacturer's Classification

  • Semiconductors > Space & High Reliability > Logic Products > Flip-Flop/Latch/Registers