Datasheet LTC1400 (Analog Devices) - 4

LTC1400
U U D IGITAL I PUTS A D DIGITAL OUTPUTS The
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denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C unless otherwise noted. (Note 5) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VOL Low Level Output Voltage VCC = 4.75V, IO = 160μA 0.05 V VCC = 4.75V, IO = 1.6mA ● 0.10 0.4 V IOZ Hi-Z Output Leakage DOUT VOUT = 0V to VCC ● ±10 μA COZ Hi-Z Output Capacitance DOUT (Note 7) 15 pF ISOURCE Output Source Current VOUT = 0V –10 mA ISINK Output Sink Current VOUT = VCC 10 mA
W U T I I G CHARACTERISTICS The
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denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C unless otherwise noted. (Note 5) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fSAMPLE(MAX) Maximum Sampling Frequency (Note 6) ● 400 kHz tCONV Conversion Time fCLK = 6.4MHz ● 2.1 μs tACQ Acquisition Time (Unipolar Mode) (Note 7) ● 230 300 ns (Bipolar Mode VSS = –5V) ● 200 270 ns fCLK CLK Frequency ● 0.1 6.4 MHz tCLK CLK Pulse Width (Notes 7, 12) ● 50 ns tWK(NAP) Time to Wake Up from Nap Mode (Note 7) 350 ns t1 CLK Pulse Width to Return to Active Mode ● 50 ns t2 CONV↑ to CLK↑ Setup Time ● 80 ns t3 CONV↑ After Leading CLK↑ ● 0 ns t4 CONV Pulse Width (Note 11) ● 50 ns t5 Time from CLK↑ to Sample Mode (Note 7) 80 ns t6 Aperture Delay of Sample-and-Hold Jitter < 50ps (Note 7) ● 45 65 ns t7 Minimum Delay Between Conversion (Unipolar Mode) ● 265 385 ns (Bipolar Mode VSS = –5V) ● 235 355 ns t8 Delay Time, CLK↑ to DOUT Valid CLOAD = 20pF ● 40 80 ns t9 Delay Time, CLK↑ to DOUT Hi-Z CLOAD = 20pF ● 40 80 ns t10 Time from Previous Data Remains Valid After CLK↑ CLOAD = 20pF ● 14 25 ns t11 Minimum Time between Nap/Sleep Request to Wake Up Request (Notes 7, 12) ● 50 ns
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 7:
Guaranteed by design, not subject to test. may cause permanent damage to the device. Exposure to any Absolute
Note 8:
Linearity, offset and full-scale specifications apply for unipolar and Maximum Rating condition for extended periods may affect device bipolar modes. reliability and lifetime.
Note 9:
Integral nonlinearity is defined as the deviation of a code from a
Note 2:
All voltage values are with respect to GND. straight line passing through the actual endpoints of the transfer curve.
Note 3:
When these pin voltages are taken below VSS (ground for unipolar The deviation is measured from the center of the quantization band. mode) or above VCC, they will be clamped by internal diodes. This product
Note 10:
Bipolar offset is the offset voltage measured from –0.5LSB when can handle input currents greater than 40mA below VSS (ground for the output code flickers between 0000 0000 0000 and 1111 1111 1111. unipolar mode) or above VCC without latch-up.
Note 11:
The rising edge of CONV starts a conversion. If CONV returns
Note 4:
When these pin voltages are taken below VSS (ground for unipolar low at a bit decision point during the conversion, it can create small errors. mode), they will be clamped by internal diodes. This product can handle For best performance ensure that CONV returns low either within 120ns input currents greater than 40mA below VSS (ground for unipolar mode) after conversion starts (i.e., before the first bit decision) or after the 14 without latch-up. These pins are not clamped to VCC. clock cycle. (Figure 13 Timing Diagram).
Note 5:
VCC = 5V, fSAMPLE = 400kHz, tr = tf = 5ns unless otherwise
Note 12:
If this timing specification is not met, the device may not respond specified. to a request for a conversion. To recover from this condition a NAP
Note 6:
Recommended operating conditions. request is required. 1400fa 4