Datasheet LTC2365, LTC2366 (Analog Devices) - 5

ManufacturerAnalog Devices
Description3Msps, 12-Bit Serial Sampling ADCs in TSOT
Pages / Page24 / 5 — t iMing characteristics The. denotes the specifications which apply over …
File Format / SizePDF / 381 Kb
Document LanguageEnglish

t iMing characteristics The. denotes the specifications which apply over the full operating temperature

t iMing characteristics The denotes the specifications which apply over the full operating temperature

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LTC2365/LTC2366
t iMing characteristics The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) LTC2365 LTC2366 SYMBOL PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX UNITS
fSMPL(MAX) Maximum Sampling Frequency (Notes 8, 9) l 1 3 MHz fSCK Shift Clock Frequency (Notes 8, 9, 10) l 0.5 16 0.5 48 MHz tSCK Shift Clock Period l 62.5 2000 20.8 2000 ns tTHROUGHPUT Minimum Throughput Time, tACQ + tCONV l 1000 333 ns tACQ Acquisition Time l 181.5 56 ns tCONV Conversion Time l 818.5 277 ns tQUIET SDO Hi-Z State to CS↓ (Notes 8, 9) l 4 4 ns t1 Minimum Positive or Negative CS Pulse Width (Notes 8) l 4 4 ns t2 SCK↓ Setup Time After CS↓ (Notes 8) l 6 2000 6 2000 ns t3 SDO Enabled Time After CS↓ (Notes 9, 11, 12) l 4 4 ns t4 SDO Data Valid Access Time After SCK↓ (Notes 8, 9, 11) l 15 15 ns t5 SCK LOW Time l 40% 40% tSCK t6 SCK HIGH Time l 40% 40% tSCK t7 SDO Data Valid Hold Time After SCK↓ (Notes 8, 9, 11) l 5 5 ns t8 SDO into Hi-Z State Time After SCK↓ (Notes 9, 12) l 5 30 5 14 ns t9 SDO into Hi-Z State Time After CS↑ (Notes 9, 12) l 4.2 4.2 ns tPOWER-UP Power-Up Time from Sleep Mode See Sleep Mode section l 1000 333 ns
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 6:
Linearity, offset and gain specifications apply for a single-ended may cause permanent damage to the device. Exposure to any Absolute AIN input with respect to GND. Maximum Rating condition for extended periods may affect device
Note 7:
Typical RMS noise at code transitions. reliability and lifetime.
Note 8:
Guaranteed by characterization. All input signals are specified with
Note 2:
All voltage values are with respect to GND. tr = tf = 2ns (10% to 90% of VDD) and timed from a voltage level of 1.6V.
Note 3:
When this pin, AIN, is taken below GND or above VDD, it will be
Note 9:
All timing specifications given are with a 10pF capacitance load. clamped by internal diodes. These products can handle input currents With a capacitance load greater than this value, a digital buffer or latch greater than 100mA below GND or above VDD without latchup. must be used.
Note 4:
VDD = OVDD = VREF = 2.35V to 3.6V, fSMPL = fSMPL(MAX) and
Note 10:
Minimum fSCK at which specifications are guaranteed. fSCK = fSCK(MAX) unless otherwise specified.
Note 11:
The time required for the output to cross the VIH or VIL voltage.
Note 5:
Integral linearity is defined as the deviation of a code from a
Note 12:
Guaranteed by design, not subject to test. straight line passing through the actual endpoints of the transfer curve. The deviation is measured from the center of the quantization band.
Note 13:
High temperatures degrade operating lifetimes. Operating lifetime is derated at temperatures greater than 105°C. 23656fb For more information www.linear.com/LTC2365 5 Document Outline Features Applications Description Typical Application Absolute Maximum Ratings Pin Configuration Order Information Converter Characteristics Analog Inputs Dynamic Accuracy Digital Inputs and Digital Outputs Power Requirement Timing Characteristics Typical Performance Characteristics Pin Functions Block Diagram Timing Diagrams Applications Information Package Description Revision History Related Parts