Datasheet LTC5596 (Analog Devices) - 7

LTC5596
elecTrical characTerisTics The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TC = 25°C. VCC = 3.3V, EN = 3.3V. CW, 50Ω source at RFIN, fRF = 2140MHz, Test circuit is shown in Figure 1. (Note 2). I-GRADE (NOTE 3) H-GRADE (NOTE 4) PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX UNITS Enable (EN) Low = Off, High = On
EN Input High Voltage (On) l 1.1 1.1 V EN Input Low Voltage (Off) l 0.6 0.6 V EN Pin Input Current 50 500 50 500 nA Turn ON Time (Note 13) 50Ω Load at OUT 8 8 µs Turn OFF Time (Note 14) 50Ω Load at OUT 45 45 ns 1MΩ||11pF Load at OUT 100 100 µs
Power Supply
Supply Voltage l 2.7 3.3 3.6 2.7 3.3 3.6 V Active Supply Current EN = 3.3V 25 30 35 25 30 35 mA Shutdown Supply Current EN = 0V 50 500 50 500 nA
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings 50MHz to 38GHz, and 0.25dB is added for 40GHz and 43.5GHz to center may cause permanent damage to the device. Exposure to any Absolute the errors over the full temperature range. See also the Application Section Maximum Rating condition for extended periods may affect device for an explanation of measurement error metrics. reliability and lifetime. The voltage on all pins should not exceed 3.8V,
Note 6:
Range for which the LOG-Linearity Error is within ±1dB. VCC + 0.3V or be less than –0.3V, otherwise damage to the ESD diodes
Note 7:
Slope of the best fit straight line obtained by linear regression. may occur.
Note 8:
Extrapolated input power level (straight line obtained by linear
Note 2:
Not production tested. Guaranteed by design and correlation to regression) where the voltage at OUT equals 0V. production tested parameters.
Note 9:
Power range for which LOG-Linearity Error is within ±1dB, relative
Note 3:
The LTC5596IDD is guaranteed functional over the case to best fit straight line for CW data (see Note 5). temperature range –40°C to 105°C. All limits at –40°C and 105°C are
Note 10:
Delay from 50% change in RFIN to 50% change in output voltage. guaranteed by design and production sample testing.
Note 11:
Time required to change voltage at OUT pin from 10% to 90% of
Note 4:
The LTC5596HDD is guaranteed functional over the case final value. Input power stepped from –55dBm to 0dBm. temperature range –40°C to 125°C. All limits at –40°C and 125°C are
Note 12:
Time required to change voltage at OUT pin from 90% to 10% of guaranteed by 100% production testing. initial value. Input power stepped from 0dBm to –55dBm.
Note 5:
LOG-Linearity Error is the input-referred power measurement
Note 13:
Time required to change voltage at OUT pin to 90% of final value. error relative to the best fit straight line (VOUT vs pin in dBm) obtained by Input power 0dBm. linear regression at TC = 25°C. The input power range used for the linear regression is from –32dBm to 5dBm for 50MHz, from –37dBm to –5dBm
Note 14:
Time required to change voltage at OUT pin to 10% of initial for 100MHz through 35GHz, from –34dBm to –5dBm for 38GHz, from value. Input power 0dBm. For higher load impedance the turn-off time –32dBm to –5dBm for 40GHz and from –28dBm to –5dBm for 43.5GHz. will be (much) larger as the OUT interface is high impedance in shutdown An offset of 0.5dB is added to the LOG-intercept for frequencies from mode. 5596f For more information www.linear.com/LTC5596 7 Document Outline Features Description Applications Typical Application Absolute Maximum Ratings Pin Configuration Order Information Electrical Characteristics Typical Performance Characteristics Pin Functions Test Circuit Applications Information Package Description Typical Application Related Parts