Datasheet ADIS16470 (Analog Devices)
| Manufacturer | Analog Devices |
| Description | Wide Dynamic Range, Miniature MEMs IMU |
| Pages / Page | 35 / 1 — Wide Dynamic Range, Miniature MEMs IMU. Data Sheet. ADIS16470. FEATURES. … |
| Revision | C |
| File Format / Size | PDF / 1.0 Mb |
| Document Language | English |
Wide Dynamic Range, Miniature MEMs IMU. Data Sheet. ADIS16470. FEATURES. GENERAL DESCRIPTION
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Wide Dynamic Range, Miniature MEMs IMU Data Sheet ADIS16470 FEATURES GENERAL DESCRIPTION Triaxial, digital gyroscope, ±2000°/sec dynamic range
The ADIS16470 is a miniature MEMS inertial measurement
8°/hr in run bias stability
unit (IMU) that includes a triaxial gyroscope and a triaxial
0.008°/sec/√Hz rms rate noise density
accelerometer. Each inertial sensor in the ADIS16470 combines
Triaxial, digital accelerometer dynamic range: ±40 g
with signal conditioning that optimizes dynamic performance.
13 µg in run bias stability
The factory calibration characterizes each sensor for sensitivity,
Triaxial, delta angle and delta velocity outputs
bias, alignment, linear acceleration (gyroscope bias), and point
Factory calibrated sensitivity, bias, and axial alignment
of percussion (accelerometer location). As a result, each sensor
Calibration temperature range: −10°C to +75°C
has dynamic compensation formulas that provide accurate
SPI compatible data communications
sensor measurements over a broad set of conditions.
Programmable operation and control
The ADIS16470 provides a simple, cost effective method for
Automatic and manual bias correction controls
integrating accurate, multiaxis inertial sensing into industrial
Data ready indicator for synchronous data acquisition
systems, especially when compared with the complexity and
External sync modes: direct, pulse, scaled, and output
investment associated with discrete designs. All necessary motion
On demand self test of inertial sensors
testing and calibration are part of the production process at the
On demand self test of flash memory
factory, greatly reducing system integration time. Tight orthogonal
Single-supply operation (VDD): 3.0 V to 3.6 V
alignment simplifies inertial frame alignment in navigation
2000 g mechanical shock survivability
systems. The serial peripheral interface (SPI) and register
Operating temperature range: −25°C to +85°C
structure provide a simple interface for data col ection and
APPLICATIONS
configuration control.
Navigation, stabilization, and instrumentation
The ADIS16470 is in a 44-bal , ball grid array (BGA) package
Unmanned and autonomous vehicles
that is approximately 11 mm × 15 mm × 11 mm.
Smart agriculture/construction machinery Factory/industrial automation, robotics Virtual/augmented reality Internet of Moving Things FUNCTIONAL BLOCK DIAGRAM DR RST VDD POWER SELF TEST INPUT/OUTPUT MANAGEMENT GND TRIAXIAL OUTPUT CS GYROSCOPE DATA REGISTERS SCLK TRIAXIAL CONTROLLER CALIBRATION ACCELEROMETER SPI AND FILTERS DIN USER TEMPERATURE CONTROL REGISTERS DOUT CLOCK ADIS16470
001
SYNC
15343- Figure 1.
Rev. A Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Tel: 781.329.4700 ©2017 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com
Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INTRODUCTION INERTIAL SENSOR SIGNAL CHAIN Gyroscope Data Sampling Accelerometer Data Sampling External Clock Options Inertial Sensor Calibration Bartlett Window FIR Filter Averaging/Decimating Filter REGISTER STRUCTURE SERIAL PERIPHERAL INTERFACE (SPI) DATA READY (DR) READING SENSOR DATA Burst Read Function DEVICE CONFIGURATION Memory Structure USER REGISTER MEMORY MAP USER REGISTER DEFINTIONS Status/Error Flag Indicators (DIAG_STAT) GYROSCOPE DATA Gyroscope Data Formatting X-Axis Gyroscope (X_GYRO_LOW and X_GYRO_OUT) Y-Axis Gyroscope (Y_GYRO_LOW and Y_GYRO_OUT) Z-Axis Gyroscope (Z_GYRO_LOW and Z_GYRO_OUT) Acceleration Data Accelerometer Resolution X-Axis Accelerometer (X_ACCL_LOW and X_ACCL_OUT) Y-Axis Accelerometer (Y_ACCL_LOW and Y_ACCL_OUT) Z-Axis Accelerometer (Z_ACCL_LOW and Z_ACCL_OUT) Internal Temperature (TEMP_OUT) Time Stamp (TIME_STAMP) Data Update Counter (DATA_CNTR) DELTA ANGLES X-Axis Delta Angle (X_DELTANG_LOW and X_DELTANG_OUT) Y-Axis Delta Angle (Y_DELTANG_LOW and Y_DELTANG_OUT) Z-Axis Delta Angle (Z_DELTANG_LOW and Z_DELTANG_OUT) Delta Angle Resolution DELTA VELOCITY X-Axis Delta Velocity (X_DELTVEL_LOW and X_DELTVEL_OUT) Y-Axis Delta Velocity (Y_DELTVEL_LOW and Y_DELTVEL_OUT) Z-Axis Delta Velocity (Z_DELTVEL_LOW and Z_DELTVEL_OUT) Delta Velocity Resolution CALIBRATION Calibration, Gyroscope Bias (XG_BIAS_LOW and XG_BIAS_HIGH) Calibration, Gyroscope Bias (YG_BIAS_LOW and YG_BIAS_HIGH) Calibration, Gyroscope Bias (ZG_BIAS_LOW and ZG_BIAS_HIGH) Calibration, Accelerometer Bias (XA_BIAS_LOW and XA_BIAS_HIGH) Calibration, Accelerometer Bias (YA_BIAS_LOW and YA_BIAS_HIGH) Calibration, Accelerometer Bias (ZA_BIAS_LOW and ZA_BIAS_HIGH) Filter Control Register (FILT_CTRL) Miscellaneous Control Register (MSC_CTRL) Point of Percussion Linear Acceleration Effect on Gyroscope Bias Internal Clock Mode Output Sync Mode Direct Sync Mode Pulse Sync Mode Scaled Sync Mode Decimation Filter (DEC_RATE) Data Update Rate in External Sync Modes Continuous Bias Estimation (NULL_CNFG) Global Commands (GLOB_CMD) Software Reset Flash Memory Test Flash Memory Update Self Test Factory Calibration Restore Bias Correction Update Firmware Revision (FIRM_REV) Firmware Revision Day and Month (FIRM_DM) Firmware Revision Year (FIRM_Y) Product Identification (PROD_ID) Serial Number (SERIAL_NUM) Scratch Registers (USER_SCR_1 to USER_SER_3) Flash Memory Endurance Counter (FLSHCNT_LOW and FLSHCNT_HIGH) APPLICATIONS INFORMATION ASSEMBLY AND HANDLING TIPS Package Attributes Assembly Tips PCB Layout Suggestions Underfill Process Validation and Control POWER SUPPLY CONSIDERATIONS EVALUATION TOOLS Breakout Board PC-Based Evaluation, EVAL-ADIS2 PACKAGING AND ORDERING INFORMATION OUTLINE DIMENSIONS ORDERING GUIDE
The ADIS16470 is a miniature MEMS inertial measurement
8°/hr in run bias stability
unit (IMU) that includes a triaxial gyroscope and a triaxial
0.008°/sec/√Hz rms rate noise density
accelerometer. Each inertial sensor in the ADIS16470 combines
Triaxial, digital accelerometer dynamic range: ±40 g
with signal conditioning that optimizes dynamic performance.
13 µg in run bias stability
The factory calibration characterizes each sensor for sensitivity,
Triaxial, delta angle and delta velocity outputs
bias, alignment, linear acceleration (gyroscope bias), and point
Factory calibrated sensitivity, bias, and axial alignment
of percussion (accelerometer location). As a result, each sensor
Calibration temperature range: −10°C to +75°C
has dynamic compensation formulas that provide accurate
SPI compatible data communications
sensor measurements over a broad set of conditions.
Programmable operation and control
The ADIS16470 provides a simple, cost effective method for
Automatic and manual bias correction controls
integrating accurate, multiaxis inertial sensing into industrial
Data ready indicator for synchronous data acquisition
systems, especially when compared with the complexity and
External sync modes: direct, pulse, scaled, and output
investment associated with discrete designs. All necessary motion
On demand self test of inertial sensors
testing and calibration are part of the production process at the
On demand self test of flash memory
factory, greatly reducing system integration time. Tight orthogonal
Single-supply operation (VDD): 3.0 V to 3.6 V
alignment simplifies inertial frame alignment in navigation
2000 g mechanical shock survivability
systems. The serial peripheral interface (SPI) and register
Operating temperature range: −25°C to +85°C
structure provide a simple interface for data col ection and
APPLICATIONS
configuration control.
Navigation, stabilization, and instrumentation
The ADIS16470 is in a 44-bal , ball grid array (BGA) package
Unmanned and autonomous vehicles
that is approximately 11 mm × 15 mm × 11 mm.
Smart agriculture/construction machinery Factory/industrial automation, robotics Virtual/augmented reality Internet of Moving Things FUNCTIONAL BLOCK DIAGRAM DR RST VDD POWER SELF TEST INPUT/OUTPUT MANAGEMENT GND TRIAXIAL OUTPUT CS GYROSCOPE DATA REGISTERS SCLK TRIAXIAL CONTROLLER CALIBRATION ACCELEROMETER SPI AND FILTERS DIN USER TEMPERATURE CONTROL REGISTERS DOUT CLOCK ADIS16470
001
SYNC
15343- Figure 1.
Rev. A Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Tel: 781.329.4700 ©2017 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com
Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INTRODUCTION INERTIAL SENSOR SIGNAL CHAIN Gyroscope Data Sampling Accelerometer Data Sampling External Clock Options Inertial Sensor Calibration Bartlett Window FIR Filter Averaging/Decimating Filter REGISTER STRUCTURE SERIAL PERIPHERAL INTERFACE (SPI) DATA READY (DR) READING SENSOR DATA Burst Read Function DEVICE CONFIGURATION Memory Structure USER REGISTER MEMORY MAP USER REGISTER DEFINTIONS Status/Error Flag Indicators (DIAG_STAT) GYROSCOPE DATA Gyroscope Data Formatting X-Axis Gyroscope (X_GYRO_LOW and X_GYRO_OUT) Y-Axis Gyroscope (Y_GYRO_LOW and Y_GYRO_OUT) Z-Axis Gyroscope (Z_GYRO_LOW and Z_GYRO_OUT) Acceleration Data Accelerometer Resolution X-Axis Accelerometer (X_ACCL_LOW and X_ACCL_OUT) Y-Axis Accelerometer (Y_ACCL_LOW and Y_ACCL_OUT) Z-Axis Accelerometer (Z_ACCL_LOW and Z_ACCL_OUT) Internal Temperature (TEMP_OUT) Time Stamp (TIME_STAMP) Data Update Counter (DATA_CNTR) DELTA ANGLES X-Axis Delta Angle (X_DELTANG_LOW and X_DELTANG_OUT) Y-Axis Delta Angle (Y_DELTANG_LOW and Y_DELTANG_OUT) Z-Axis Delta Angle (Z_DELTANG_LOW and Z_DELTANG_OUT) Delta Angle Resolution DELTA VELOCITY X-Axis Delta Velocity (X_DELTVEL_LOW and X_DELTVEL_OUT) Y-Axis Delta Velocity (Y_DELTVEL_LOW and Y_DELTVEL_OUT) Z-Axis Delta Velocity (Z_DELTVEL_LOW and Z_DELTVEL_OUT) Delta Velocity Resolution CALIBRATION Calibration, Gyroscope Bias (XG_BIAS_LOW and XG_BIAS_HIGH) Calibration, Gyroscope Bias (YG_BIAS_LOW and YG_BIAS_HIGH) Calibration, Gyroscope Bias (ZG_BIAS_LOW and ZG_BIAS_HIGH) Calibration, Accelerometer Bias (XA_BIAS_LOW and XA_BIAS_HIGH) Calibration, Accelerometer Bias (YA_BIAS_LOW and YA_BIAS_HIGH) Calibration, Accelerometer Bias (ZA_BIAS_LOW and ZA_BIAS_HIGH) Filter Control Register (FILT_CTRL) Miscellaneous Control Register (MSC_CTRL) Point of Percussion Linear Acceleration Effect on Gyroscope Bias Internal Clock Mode Output Sync Mode Direct Sync Mode Pulse Sync Mode Scaled Sync Mode Decimation Filter (DEC_RATE) Data Update Rate in External Sync Modes Continuous Bias Estimation (NULL_CNFG) Global Commands (GLOB_CMD) Software Reset Flash Memory Test Flash Memory Update Self Test Factory Calibration Restore Bias Correction Update Firmware Revision (FIRM_REV) Firmware Revision Day and Month (FIRM_DM) Firmware Revision Year (FIRM_Y) Product Identification (PROD_ID) Serial Number (SERIAL_NUM) Scratch Registers (USER_SCR_1 to USER_SER_3) Flash Memory Endurance Counter (FLSHCNT_LOW and FLSHCNT_HIGH) APPLICATIONS INFORMATION ASSEMBLY AND HANDLING TIPS Package Attributes Assembly Tips PCB Layout Suggestions Underfill Process Validation and Control POWER SUPPLY CONSIDERATIONS EVALUATION TOOLS Breakout Board PC-Based Evaluation, EVAL-ADIS2 PACKAGING AND ORDERING INFORMATION OUTLINE DIMENSIONS ORDERING GUIDE
