Datasheet ADIS16080 (Analog Devices) - 10

ManufacturerAnalog Devices
Description±80°/sec Yaw Rate Gyro with SPI Interface
Pages / Page17 / 10 — ADIS16080. –400. 600. 30 PART AVERAGE, VCC = 4.75V. –420. 580. 30 PART …
RevisionC
File Format / SizePDF / 579 Kb
Document LanguageEnglish

ADIS16080. –400. 600. 30 PART AVERAGE, VCC = 4.75V. –420. 580. 30 PART AVERAGE, VCC = 5.00V. 30 PART AVERAGE, TA = –40°C

ADIS16080 –400 600 30 PART AVERAGE, VCC = 4.75V –420 580 30 PART AVERAGE, VCC = 5.00V 30 PART AVERAGE, TA = –40°C

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Text Version of Document

ADIS16080 –400 600 30 PART AVERAGE, VCC = 4.75V –420 580 30 PART AVERAGE, VCC = 5.00V 30 PART AVERAGE, TA = –40°C 30 PART AVERAGE, VCC = 5.25V –440 560 ) ) SB –460 L SB 540 ( (L –480 520 VEL E VEL E L –500 T L 500 30 PART AVERAGE, TA = +25°C ES –520 EST -T 480 F -T L F –540 SE 460 SEL 30 PART AVERAGE, T –560 A = +85°C 440 –580 420 –600 400 4.7 4.8 4.9 5.0 5.1 5.2 5.3
1
–50 –30 –10 10 30 50 70 90 110
14 -01 0 5-
V
45
CC (V)
60
TEMPERATURE (°C)
604 0 0 Figure 12. Self-Test 1 vs. Supply Voltage Figure 15. Self-Test 2 vs. Temperature
600 0 30 PART AVERAGE, VCC = 4.75V 30 PART AVERAGE, TA = +85°C 30 PART AVERAGE, VCC = 5.00V 30 PART AVERAGE, VCC = 5.25V –0.5 ) 550 SB ) L ( SB 30 PART AVERAGE, TA = +25°C (L –1.0 VEL E VEL L 500 E T L ES -T –1.5 SET F F L F O SE 450 30 PART AVERAGE, TA = –40°C –2.0 400 –2.5 4.7 4.8 4.9 5.0 5.1 5.2 5.3
2
–50 –30 –10 10 30 50 70 90 110
15 -01 0 5-
V
45
CC (V)
60
TEMPERATURE (°C)
604 0 0 Figure 13. Self-Test 2 vs. Supply Voltage Figure 16. ADC Offset vs. Temperature and Supply Voltage
–400 1.0 30 PART AVERAGE, VCC = 4.75V 30 PART AVERAGE, VCC = 4.75V 30 PART AVERAGE, V 30 PART AVERAGE, V –420 CC = 5.00V 0.9 CC = 5.00V 30 PART AVERAGE, VCC = 5.25V 30 PART AVERAGE, VCC = 5.25V 0.8 –440 ) SB 0.7 –460 B) (L S L 0.6 VEL –480 R ( E L RO 0.5 R –500 EST N E 0.4 -T F AI –520 G 0.3 SEL –540 0.2 –560 0.1 –580 0 –50 –40 –30 –20 –10 0 10 20 30 40 50 60 70 80 90 100
13
–50 –30 –10 10 30 50 70 90 110
16 0 0 5- 5-
TEMPERATURE (°C)
604
TEMPERATURE (°C)
604 0 0 Figure 14. Self-Test 1 vs. Temperature Figure 17. ADC Gain Error vs. Temperature (Excluding VREF) Rev. $ | Page 9 of 16 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION SUPPLY AND COMMON CONSIDERATIONS INCREASING MEASUREMENT RANGE SETTING BANDWIDTH SELF-TEST FUNCTION CONTINUOUS SELF-TEST RATE SENSITIVE AXIS BASIC OPERATION SERIAL PERIPHERAL INTERFACE (SPI) Control Register ADC Conversion Output Data Access Output Coding Examples APPLICATIONS INFORMATION ASSEMBLY INTERFACE BOARD OUTLINE DIMENSIONS ORDERING GUIDE