Datasheet AD844 (Analog Devices) - 9

ManufacturerAnalog Devices
Description60 MHz, 2000 V/μs, Monolithic Op Amp with Quad Low Noise
Pages / Page12 / 9 — STANDARD. 5962-89644. MICROCIRCUIT DRAWING
File Format / SizePDF / 75 Kb
Document LanguageEnglish

STANDARD. 5962-89644. MICROCIRCUIT DRAWING

STANDARD 5962-89644 MICROCIRCUIT DRAWING

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TABLE IIA. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical 1 1 1 parameters (see 4.2) Final electrical 1,2,3,4,5,6 1/ 2/ 1,2,3, 1/ 2/ 1,2,3, 1/ 2/ 3/ parameters (see 4.2) 4,5,6 4,5,6 Group A test 1,2,3,4,5,6 2/ 1,2,3,4,5,6 2/ 1,2,3,4,5,6 2/ requirements (see 4.4) Group C end-point electrical 1 1 1 3/ parameters (see 4.4) Group D end-point electrical 1 1 1 parameters (see 4.4) Group E end-point electrical 1 1 1 parameters (see 4.4) 1/ PDA applies to subgroup 1. VOS, IOS, and deltas excluded from PDA. 2/ Subgroup 4, 5, and 6 if not tested, shall be guaranteed to the limits specified in table I herein. 3/ Delta limits as specified in table IIB shall be required where specified, and delta limits shall be computed with reference to the previous endpoint electrical parameters. TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. Test Symbol End point Delta Input offset voltage VOS 300 V 150 V 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
SIZE
5962-89644 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990
E 9
DSCC FORM 2234 APR 97