Automotive-Grade, Galvanically Isolated Current Sensor IC with Common-Mode Field Rejection and Overcurrent Detection in Small Footprint Low-Profile Packages
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Automotive-Grade, Galvanically Isolated Current Sensor IC. ACS71240
Automotive-Grade, Galvanically Isolated Current Sensor ICACS71240with Common-Mode Field Rejection and Overcurrent Detectionin Small Footprint Low-Profile PackagesACS71240KEXBLT-030B3 PERFORMANCE CHARACTERISTICS: Over full range of TA, VCC = 3.3 V, unless otherwise specified CharacteristicSymbolTest ConditionsMin. Typ. [1]Max.UnitNOMINAL PERFORMANCE Optimized Sensing Range IPR –30 – 30 A Sensitivity Sens IPR(min) < IP < IPR(max) – 44 – mV/A Zero-Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 1.65 – V ACCURACY PERFORMANCE I Total Output Error [2] E P = 10 A, TA = 25°C to 125°C –2.5 ±0.8 2.5 % TOT IP = 10 A, TA = –40°C to 25°C –6 ±1.9 6 % TOTAL OUTPUT ERROR COMPONENTS [3] ETOT = ESENS + 100 × VOE / (Sens × IP) I Sensitivity Error E P = 10 A, TA = 25°C to 125°C –2 ±0.9 2 % SENS IP = 10 A, TA = –40°C to 25°C –5.5 ±1.5 5.5 % I Offset Voltage Error V P = 0 A, TA = 25°C to 125°C –15 ±3.71 15 mV OE IP = 0 A, TA = –40°C to 25°C –30 ±7.1 30 mV ACCURACY PERFORMANCE INCLUDING LIFETIME DRIFT [4] Total Output Error Including IP = 10 A, TA = 25°C to 125°C –5.7 ±1.8 5.7 % Lifetime Drift [5] ETOT_drift IP = 10 A, TA = –40°C to 25°C –6 ±1.5 6 % Sensitivity Error Including IP = 10 A, TA = 25°C to 125°C –5.1 ±1.2 5.1 % Lifetime Drift [6] ESENS_drift IP = 10 A, TA = –40°C to 25°C –5.6 ±1.2 5.6 % Offset Voltage Error Including IP = 0 A, TA = 25°C to 125°C –28 ±4.5 28 mV Lifetime Drift [7] VOE_drift IP = 0 A, TA = –40°C to 25°C –30 ±4.3 30 mV [1] Typical values with ± are 3 sigma values, except for lifetime drift, which are the average value including drift (from the worst case stress) after AEC-Q100 qualification. [2] Percentage of IP. [3] A single device will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. [4] Lifetime drift characteristics are based on AEC-Q100 qualification results. [5] All devices stayed within min/max limits throughout AEC-Q100 qualification. The worst drift observed was 6.1%. [6] All devices stayed within min/max limits throughout AEC-Q100 qualification. The worst drift observed was 4%. [7] All devices stayed within min/max limits throughout AEC-Q100 qualification. The worst drift observed was 22 mV. 9 Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com