Datasheet ADXL375 (Analog Devices) - 6

ManufacturerAnalog Devices
Description3-Axis, ±200 g Digital MEMS Accelerometer
Pages / Page10 / 6 — DLA LAND AND MARITIME. COLUMBUS, OHIO. 16236. V62/18612
File Format / SizePDF / 174 Kb
Document LanguageEnglish

DLA LAND AND MARITIME. COLUMBUS, OHIO. 16236. V62/18612

DLA LAND AND MARITIME COLUMBUS, OHIO 16236 V62/18612

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TABLE I. Electrical performance characteristics - Continued. 1/ 1/ Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization and/or design. 2/ TA = 25°C, VS = 2.5 V, VDD I/O = 2.5 V, acceleration = 0 g, CS = 10 μF tantalum, CI/O = 0.1 μF, and output data rate (ODR) = 800 Hz, unless otherwise noted. 3/ Typical specifications are for at least 68% of the population of devices and are based on the worst case of mean ± 1 σ distribution, except for sensitivity, which represents the target value. 4/ Minimum and maximum specifications represent the worst case of mean ± 3 σ distribution and are not guaranteed in production. 5/ Cross axis sensitivity is defined as coupling between any two axes. 6/ The output format for the 1600 Hz and 3200 Hz output data rates is different from the output format for the other output data rates. For more information, see manufacturer data sheet. 7/ Bandwidth is the −3 dB frequency and is half the output data rate: bandwidth = ODR/2. 8/ Output data rates < 6.25 Hz exhibit additional offset shift with increased temperature. 9/ Self test change is defined as the output (g) when the SELF_TEST bit = 1 (DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0. Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self test, where τ = 1/(data rate). For the self test to operate correctly, the part must be in normal power operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C). 10/ Turn on and wake-up times are determined by the user defined bandwidth. At a 100 Hz data rate, the turn on and wake-up times are each approximately 11.1 ms. For other data rates, the turn on and wake-up times are each approximately τ + 1.1 ms, where τ = 1/(data rate).
DLA LAND AND MARITIME
SIZE CODE IDENT NO. DWG NO.
COLUMBUS, OHIO A 16236 V62/18612
REV PAGE 6 Document Outline DESCRIPTION REV REV PMIC N/A TITLE SIZE A V62/18612 REV