Measured from the positive-going edge of IC2's output to the circuit's output at Q1's collector, the relative jitter averages less than 1 µsec
| Authors | Alfredo Saab |
| Main Document | Article «Novel circuit isolates temperature sensor from its host» |
| Description | Figure 2 |
| File Format / Size | PDF / 56 Kb |
| Document Language | English |
Other Materials from the Main Document
- Article «Novel circuit isolates temperature sensor from its host»
- Figure 1. Transformer T1 isolates the temperature sensor, IC2, from the equipment under test. The period of IC1's digital output varies as a function of temperature. The circuit's output period varies at a rate of 10 µsec/K
- Figure 2. Measured from the positive-going edge of IC2's output to the circuit's output at Q1's collector, the relative jitter averages less than 1 µsec
- Figure 3. As in Figure 2, Q1's average output jitter with respect to IC1's negative-going output also averages less than 1 µsec
