Datasheet Texas Instruments OPA552FA/500
Manufacturer | Texas Instruments |
Series | OPA552 |
Part Number | OPA552FA/500 |
High-Voltage, High-Current Operational Amplifiers 7-DDPAK/TO-263 -40 to 125
Datasheets
OPA55x High-Voltage, High-Current Operational Amplifiers datasheet
PDF, 1.2 Mb, Revision: B, File published: Jan 7, 2016
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Status
Lifecycle Status | Active (Recommended for new designs) |
Manufacture's Sample Availability | No |
Packaging
Pin | 7 |
Package Type | KTW |
Industry STD Term | TO-263 |
JEDEC Code | R-PSFM-G |
Package QTY | 500 |
Carrier | LARGE T&R |
Device Marking | OPA552FA |
Width (mm) | 8.89 |
Length (mm) | 10.1 |
Thickness (mm) | 4.44 |
Pitch (mm) | 1.27 |
Max Height (mm) | 4.65 |
Mechanical Data | Download |
Parametrics
Additional Features | Decompensated |
Architecture | FET |
CMRR(Min) | 92 dB |
CMRR(Typ) | 102 dB |
GBW(Typ) | 12 MHz |
Input Bias Current(Max) | 100 pA |
Iq per channel(Max) | 8.5 mA |
Iq per channel(Typ) | 7 mA |
Number of Channels | 1 |
Offset Drift(Typ) | 7 uV/C |
Operating Temperature Range | -40 to 125 C |
Output Current(Typ) | 380 mA |
Package Group | DDPAK/TO-263 |
Package Size: mm2:W x L | 7DDPAK/TO-263: 154 mm2: 15.24 x 10.1(DDPAK/TO-263) PKG |
Rail-to-Rail | No |
Rating | Catalog |
Slew Rate(Typ) | 24 V/us |
Total Supply Voltage(Max) | 60 +5V=5, +/-5V=10 |
Total Supply Voltage(Min) | 8 +5V=5, +/-5V=10 |
Vos (Offset Voltage @ 25C)(Max) | 3 mV |
Eco Plan
RoHS | Compliant |
Design Kits & Evaluation Modules
- Evaluation Modules & Boards: OPAMPEVM
Universal Operational Amplifier Evaluation Module
Lifecycle Status: Active (Recommended for new designs)
Application Notes
- Optoelectronics Circuit CollectionPDF, 261 Kb, File published: Jun 11, 2001
This application report presents a collection of analog circuits that may be useful in electro-optic applications such as optical networking. The circuits are Avalanche Photodiode Bias Supply 1; Linear TEC Driver-1, -2, and -3; Laser Diode Driver-1 and -2; and Temperature Under- and Over-range Sensing with a Window Comparator. - MTTF, Failrate, Reliability, and Life TestingPDF, 51 Kb, File published: Oct 4, 2000
At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr
Model Line
Series: OPA552 (10)
Manufacturer's Classification
- Semiconductors > Amplifiers > Operational Amplifiers (Op Amps) > Power Op Amps