Datasheet Texas Instruments THS1030CDWG4

ManufacturerTexas Instruments
SeriesTHS1030
Part NumberTHS1030CDWG4
Datasheet Texas Instruments THS1030CDWG4

10-Bit, 30 MSPS ADC Single Ch., Pin Comp. w/TLC876, Out of Range Indicator, PowerDown 28-SOIC 0 to 70

Datasheets

3-V to 5.5-V 10-Bit, 30 MSPS CMOS Analog-to-Digital Converter datasheet
PDF, 1.0 Mb, Revision: E, File published: Oct 30, 2003
Extract from the document

Prices

Status

Lifecycle StatusObsolete (Manufacturer has discontinued the production of the device)
Manufacture's Sample AvailabilityNo

Packaging

Pin28
Package TypeDW
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Width (mm)7.5
Length (mm)17.9
Thickness (mm)2.35
Pitch (mm)1.27
Max Height (mm)2.65
Mechanical DataDownload

Replacements

ReplacementADS825E
Replacement CodeP

Parametrics

# Input Channels1
Analog Input BW(MHz)150
Approx. Price (US$)6.94 | 100u
ArchitecturePipeline
DNL(Max)(+/-LSB)1
ENOB(Bits)7.8
INL(Max)(+/-LSB)2
Input BufferNo
Input Range2V (p-p)
InterfaceParallel CMOS
Operating Temperature Range(C)-40 to 85
0 to 70
Package GroupTSSOP
Package Size: mm2:W x L (PKG)28TSSOP: 62 mm2: 6.4 x 9.7(TSSOP)
Power Consumption(Typ)(mW)150
RatingCatalog
Reference ModeExt
Int
Resolution(Bits)10
SFDR(dB)53
SINAD(dB)48.6
SNR(dB)49.4
Sample Rate(Max)(MSPS)30

Eco Plan

RoHSNot Compliant
Pb FreeNo

Design Kits & Evaluation Modules

  • Evaluation Modules & Boards: TSW2200EVM
    TSW2200EVM: Low Cost Portable Power Supply
    Lifecycle Status: Active (Recommended for new designs)

Application Notes

  • CDCE62005 as Clock Solution for High-Speed ADCs
    PDF, 805 Kb, File published: Sep 4, 2008
    TI has introduced a family of devices well-suited to meet the demands for high-speed ADC devices such as the ADS5527 which is capable of sampling up to 210 MSPS. To realize the full potential of these high-performance products it is imperative to provide a low phase noise clock source. The CDCE62005 clock synthesizer chip offers a real-world clocking solution to meet these stringent requirements
  • Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
    PDF, 376 Kb, File published: Apr 28, 2009
    This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
  • Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
    PDF, 327 Kb, Revision: A, File published: Sep 10, 2010
    This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
  • Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
    PDF, 2.3 Mb, File published: Jun 2, 2008
    This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
  • CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
    PDF, 424 Kb, File published: Jun 8, 2008
    Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
  • Noise Analysis for High Speed Op Amps (Rev. A)
    PDF, 256 Kb, Revision: A, File published: Jan 17, 2005
    As system bandwidths have increased an accurate estimate of the noise contribution for each element in the signal channel has become increasingly important. Many designers are not however particularly comfortable with the calculations required to predict the total noise for an op amp or in the conversions between the different descriptions of noise. Considerable inconsistency between manufactu

Model Line

Manufacturer's Classification

  • Semiconductors > Data Converters > Analog to Digital Converter > High Speed ADC (>10MSPS)