SN54AC02-DIE
www.ti.com SCHS392 – MAY 2013 RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-NOR GATES
Check for Samples: SN54AC02-DIE FEATURES 1 (1) AC Types Feature 1.5-V to 5.5-V Operation
Rad-Tolerant: 50 KRad(Si) TID (1) – TID Dose Rate < 2 mRad/sec Radiation tolerance is a typical value based upon initial device
qualification. Radiation Lot Acceptance Testing is available contact factory for details. DESCRIPTION
The SN54AC02-DIE device contains four independent 2-input NOR gates that perform the Boolean function
Y = A B or Y = A + B in positive logic.
ORDERING INFORMATION (1) (1)
(2) PRODUCT PACKAGE
DESIGNATOR PACKAGE SN54AC02 TD Bare die in waffle pack (2) ORDERABLE PART NUMBER PACKAGE QUANTITY SN54AC02VTD1 100 SN54AC02VTD2 10 For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters. Copyright В© 2013, Texas Instruments Incorporated SN54AC02-DIE
SCHS392 – MAY 2013 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more …
