Datasheet Texas Instruments ADS5517
| Manufacturer | Texas Instruments |
| Series | ADS5517 |
11-Bit, 200-MSPS Analog-to-Digital Converter (ADC)
Datasheets
11-Bit, 200 MSPS ADC datasheet
PDF, 1.8 Mb, File published: Dec 13, 2007
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Status
| ADS5517IRGZR | ADS5517IRGZT | |
|---|---|---|
| Lifecycle Status | Active (Recommended for new designs) | Active (Recommended for new designs) |
| Manufacture's Sample Availability | No | No |
Packaging
| ADS5517IRGZR | ADS5517IRGZT | |
|---|---|---|
| N | 1 | 2 |
| Pin | 48 | 48 |
| Package Type | RGZ | RGZ |
| Industry STD Term | VQFN | VQFN |
| JEDEC Code | S-PQFP-N | S-PQFP-N |
| Package QTY | 2500 | 250 |
| Carrier | LARGE T&R | SMALL T&R |
| Device Marking | AZ5517 | AZ5517 |
| Width (mm) | 7 | 7 |
| Length (mm) | 7 | 7 |
| Thickness (mm) | .9 | .9 |
| Pitch (mm) | .5 | .5 |
| Max Height (mm) | 1 | 1 |
| Mechanical Data | Download | Download |
Parametrics
| Parameters / Models | ADS5517IRGZR | ADS5517IRGZT |
|---|---|---|
| # Input Channels | 1 | 1 |
| Analog Input BW, MHz | 700 | 700 |
| Architecture | Pipeline | Pipeline |
| DNL(Max), +/-LSB | 1 | 1 |
| DNL(Typ), +/-LSB | 0.3 | 0.3 |
| ENOB, Bits | 10.8 | 10.8 |
| INL(Max), +/-LSB | 1.5 | 1.5 |
| INL(Typ), +/-LSB | 0.6 | 0.6 |
| Input Buffer | No | No |
| Input Range, Vp-p | 2 | 2 |
| Interface | Parallel CMOS | Parallel CMOS |
| Operating Temperature Range, C | -40 to 85 | -40 to 85 |
| Package Group | VQFN | VQFN |
| Package Size: mm2:W x L, PKG | 48VQFN: 49 mm2: 7 x 7(VQFN) | 48VQFN: 49 mm2: 7 x 7(VQFN) |
| Power Consumption(Typ), mW | 1230 | 1230 |
| Rating | Catalog | Catalog |
| Reference Mode | Ext,Int | Ext,Int |
| Resolution, Bits | 11 | 11 |
| SFDR, dB | 84 | 84 |
| SINAD, dB | 66 | 66 |
| SNR, dB | 66 | 66 |
| Sample Rate(Max), MSPS | 200 | 200 |
Eco Plan
| ADS5517IRGZR | ADS5517IRGZT | |
|---|---|---|
| RoHS | Compliant | Compliant |
Application Notes
- QFN Layout GuidelinesPDF, 1.3 Mb, File published: Jul 28, 2006
Board layout and stencil information for most Texas Instruments Quad Flat No-Lead (QFN) devices is provided in their data sheets. This document helps printed-circuit board designers understand and better use this information for optimal designs. - Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)PDF, 2.0 Mb, Revision: A, File published: May 22, 2015
- Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)PDF, 1.2 Mb, Revision: A, File published: Jul 19, 2013
- Smart Selection of ADC/DAC Enables Better Design of Software-Defined RadioPDF, 376 Kb, File published: Apr 28, 2009
This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs. - Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)PDF, 327 Kb, Revision: A, File published: Sep 10, 2010
This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir - Phase Noise Performance and Jitter Cleaning Ability of CDCE72010PDF, 2.3 Mb, File published: Jun 2, 2008
This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig - CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital ConvertersPDF, 424 Kb, File published: Jun 8, 2008
Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers - Principles of Data Acquisition and Conversion (Rev. A)PDF, 132 Kb, Revision: A, File published: Apr 16, 2015
- A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)PDF, 425 Kb, Revision: B, File published: Oct 9, 2011
This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference. - Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)PDF, 69 Kb, Revision: A, File published: May 18, 2015
Model Line
Series: ADS5517 (2)
Manufacturer's Classification
- Semiconductors> Data Converters> Analog-to-Digital Converters (ADCs)> High Speed ADCs (>10MSPS)
