Datasheet Texas Instruments DS90C031TMX/NOPB
Manufacturer | Texas Instruments |
Series | DS90C031 |
Part Number | DS90C031TMX/NOPB |
LVDS Quad CMOS Differential Line Driver 16-SOIC -40 to 85
Datasheets
DS90C031 LVDS Quad CMOS Differential Line Driver datasheet
PDF, 305 Kb, Revision: A, File published: May 14, 2004
Extract from the document
Prices
Status
Lifecycle Status | Active (Recommended for new designs) |
Manufacture's Sample Availability | No |
Packaging
Pin | 16 |
Package Type | D |
Industry STD Term | SOIC |
JEDEC Code | R-PDSO-G |
Package QTY | 2500 |
Carrier | LARGE T&R |
Device Marking | DS90C031TM |
Width (mm) | 3.91 |
Length (mm) | 9.9 |
Thickness (mm) | 1.58 |
Pitch (mm) | 1.27 |
Max Height (mm) | 1.75 |
Mechanical Data | Download |
Parametrics
Device Type | Driver |
ESD HBM | 3.5 kV |
Function | Driver |
ICC(Max) | 25 mA |
Input Signal | TTL |
No. of Rx | 4 |
No. of Tx | 4 |
Operating Temperature Range | -40 to 85 C |
Output Signal | LVDS |
Package Group | SOIC |
Package Size: mm2:W x L | 16SOIC: 59 mm2: 6 x 9.9(SOIC) PKG |
Protocols | LVDS |
Signaling Rate | 155.5 Mbps |
Eco Plan
RoHS | Compliant |
Application Notes
- AN-1110 LVDS Quad Dynamic I CC vs FrequencyPDF, 198 Kb, File published: May 15, 2004
Application Note 1110 LVDS Quad Dynamic I CC vs Frequency - An Overview of LVDS TechnologyPDF, 207 Kb, File published: Oct 5, 1998
- LVDS Signal Quality: Cable Drive Measurements using Eye Patterns Test Report #3PDF, 170 Kb, File published: May 15, 2004
Application Note 1088 LVDS Signal Quality: Cable Drive Measurements using Eye Pattern s Test Report #3 - LVDS Performance: Bit Error Rate (BER) Testing Test Report #2PDF, 82 Kb, File published: Oct 4, 2004
- LVDS Signal Quality: Jitter Measurements Using Eye Patterns Test Report #1PDF, 103 Kb, File published: Oct 5, 1998
Model Line
Series: DS90C031 (3)
- DS90C031TM DS90C031TM/NOPB DS90C031TMX/NOPB
Manufacturer's Classification
- Semiconductors > Interface > LVDS/M-LVDS/PECL > Buffers, Drivers/Receivers and Cross-Points