Datasheet Texas Instruments SCAN921224

SCAN921023, SCAN921224
www.ti.com SNLS133D – JAN 2001 – REVISED APRIL 2013 SCAN921023 and SCAN921224 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer
with IEEE 1149.1 (JTAG) and at-speed BIST
Check for Samples: SCAN921023, SCAN921224 FEATURES DESCRIPTION The SCAN921023 transforms a 10-bit wide parallel
LVCMOS/LVTTL data bus into a single high speed
Bus LVDS serial data stream with embedded clock.
The SCAN921224 receives the Bus LVDS serial data
stream and transforms it back into a 10-bit wide
parallel data bus and recovers parallel clock. Both
devices are compliant with IEEE 1149.1 Standard
Test Access Port and Boundary Scan Architecture
with the incorporation of the defined boundary-scan
test logic and test access port consisting of Test Data
Input (TDI), Test Data Out (TDO), Test Mode Select
(TMS), Test Clock (TCK), and the optional Test Reset
(TRST). IEEE 1149.1 features provide the designer or
test engineer access to the backplane or cable
interconnects and the ability to verify differential
signal integrity to enhance their system test strategy.
The pair of devices also features an at-speed BIST
mode which allows the interconnects between the
Serializer and Deserializer to be verified at-speed. 1 2 IEEE 1149.1 (JTAG) Compliant and At-Speed
BIST Test Mode …