Datasheet Texas Instruments SNJ54BCT8373AFK

ManufacturerTexas Instruments
SeriesSN54BCT8373A
Part NumberSNJ54BCT8373AFK
Datasheet Texas Instruments SNJ54BCT8373AFK

Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125

Datasheets

Scan Test Devices With Octal D-Type Latches datasheet
PDF, 421 Kb, Revision: F, File published: Jul 1, 1996
Extract from the document

Prices

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Packaging

Pin28282828
Package TypeFKFKFKFK
Industry STD TermLCCCLCCCLCCCLCCC
JEDEC CodeS-CQCC-NS-CQCC-NS-CQCC-NS-CQCC-N
Package QTY1111
CarrierTUBETUBETUBETUBE
Device Marking5962-SNJ54BCT9172501M3A8373AFK
Width (mm)11.4311.4311.4311.43
Length (mm)11.4311.4311.4311.43
Thickness (mm)1.831.831.831.83
Pitch (mm)1.271.271.271.27
Max Height (mm)2.032.032.032.03
Mechanical DataDownloadDownloadDownloadDownload

Parametrics

Bits8
ICC @ Nom Voltage(Max)52 mA
Input TypeTTL
Operating Temperature Range-55 to 125 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Output TypeTTL
Package GroupLCCC
Package Size: mm2:W x L28LCCC: 131 mm2: 11.43 x 11.43(LCCC) PKG
RatingMilitary
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
tpd @ Nom Voltage(Max)9.5 ns

Eco Plan

RoHSSee ti.com

Model Line

Manufacturer's Classification

  • Semiconductors > Space & High Reliability > Logic Products > Specialty Logic Products > Boundary Scan (JTAG)