Datasheet Texas Instruments SNJ54BCT8373AJT

ManufacturerTexas Instruments
SeriesSN54BCT8373A
Part NumberSNJ54BCT8373AJT
Datasheet Texas Instruments SNJ54BCT8373AJT

Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125

Datasheets

Scan Test Devices With Octal D-Type Latches datasheet
PDF, 421 Kb, Revision: F, File published: Jul 1, 1996
Extract from the document

Prices

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Packaging

Pin24242424
Package TypeJTJTJTJT
Industry STD TermCDIPCDIPCDIPCDIP
JEDEC CodeR-GDIP-TR-GDIP-TR-GDIP-TR-GDIP-T
Package QTY1111
CarrierTUBETUBETUBETUBE
Device MarkingA5962-9172501MLTSNJ54BCT8373AJ
Width (mm)6.926.926.926.92
Length (mm)32323232
Thickness (mm)4.74.74.74.7
Pitch (mm)2.542.542.542.54
Max Height (mm)5.085.085.085.08
Mechanical DataDownloadDownloadDownloadDownload

Parametrics

Bits8
ICC @ Nom Voltage(Max)52 mA
Input TypeTTL
Operating Temperature Range-55 to 125 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Output TypeTTL
Package GroupCDIP
Package Size: mm2:W x LSee datasheet (CDIP) PKG
RatingMilitary
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
tpd @ Nom Voltage(Max)9.5 ns

Eco Plan

RoHSSee ti.com

Model Line

Manufacturer's Classification

  • Semiconductors > Space & High Reliability > Logic Products > Specialty Logic Products > Boundary Scan (JTAG)