Datasheet Texas Instruments SN74BCT8245ADWR
Manufacturer | Texas Instruments |
Series | SN74BCT8245A |
Part Number | SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70
Datasheets
Scan Test Devices With Octal Bus Transceivers datasheet
PDF, 722 Kb, Revision: E, File published: Jul 1, 1996
Extract from the document
Prices
Status
Lifecycle Status | Active (Recommended for new designs) |
Manufacture's Sample Availability | No |
Packaging
Pin | 24 |
Package Type | DW |
Industry STD Term | SOIC |
JEDEC Code | R-PDSO-G |
Package QTY | 2000 |
Carrier | LARGE T&R |
Device Marking | BCT8245A |
Width (mm) | 7.5 |
Length (mm) | 15.4 |
Thickness (mm) | 2.35 |
Pitch (mm) | 1.27 |
Max Height (mm) | 2.65 |
Mechanical Data | Download |
Parametrics
Bits | 8 |
F @ Nom Voltage(Max) | 70 Mhz |
ICC @ Nom Voltage(Max) | 52 mA |
Operating Temperature Range | 0 to 70 C |
Output Drive (IOL/IOH)(Max) | 64/-15 mA |
Package Group | SOIC |
Package Size: mm2:W x L | 24SOIC: 160 mm2: 10.3 x 15.5(SOIC) PKG |
Rating | Catalog |
Technology Family | BCT |
VCC(Max) | 5.5 V |
VCC(Min) | 4.5 V |
Voltage(Nom) | 5 V |
tpd @ Nom Voltage(Max) | 10 ns |
Eco Plan
RoHS | Compliant |
Application Notes
- Programming CPLDs Via the 'LVT8986 LASPPDF, 819 Kb, File published: Nov 1, 2005
This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
Model Line
Series: SN74BCT8245A (2)
- SN74BCT8245ADW SN74BCT8245ADWR
Manufacturer's Classification
- Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic