Datasheet Texas Instruments SN74BCT8373ADW

ManufacturerTexas Instruments
SeriesSN74BCT8373A
Part NumberSN74BCT8373ADW
Datasheet Texas Instruments SN74BCT8373ADW

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70

Datasheets

Scan Test Devices With Octal D-Type Latches datasheet
PDF, 421 Kb, Revision: F, File published: Jul 1, 1996
Extract from the document

Prices

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Packaging

Pin24
Package TypeDW
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Package QTY25
CarrierTUBE
Device MarkingBCT8373A
Width (mm)7.5
Length (mm)15.4
Thickness (mm)2.35
Pitch (mm)1.27
Max Height (mm)2.65
Mechanical DataDownload

Parametrics

Bits8
F @ Nom Voltage(Max)70 Mhz
ICC @ Nom Voltage(Max)52 mA
Operating Temperature Range0 to 70 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Package GroupSOIC
Package Size: mm2:W x L24SOIC: 160 mm2: 10.3 x 15.5(SOIC) PKG
RatingCatalog
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
Voltage(Nom)5 V
tpd @ Nom Voltage(Max)9.5 ns

Eco Plan

RoHSCompliant

Application Notes

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, File published: Nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to

Model Line

Series: SN74BCT8373A (1)
  • SN74BCT8373ADW

Manufacturer's Classification

  • Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic