Datasheet Texas Instruments SN74BCT8374DW
| Manufacturer | Texas Instruments |
| Series | SN74BCT8374 |
| Part Number | SN74BCT8374DW |
Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70
Datasheets
Prices
Status
| Lifecycle Status | Obsolete (Manufacturer has discontinued the production of the device) |
| Manufacture's Sample Availability | No |
Packaging
| Pin | 24 |
| Package Type | DW |
| Industry STD Term | SOIC |
| JEDEC Code | R-PDSO-G |
| Width (mm) | 7.5 |
| Length (mm) | 15.4 |
| Thickness (mm) | 2.35 |
| Pitch (mm) | 1.27 |
| Max Height (mm) | 2.65 |
| Mechanical Data | Download |
Eco Plan
| RoHS | Not Compliant |
| Pb Free | No |
Model Line
Series: SN74BCT8374 (3)
- SN74BCT8374DW SN74BCT8374DWR SN74BCT8374NT
Manufacturer's Classification
- Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic
