Datasheet Texas Instruments SN74BCT8374

ManufacturerTexas Instruments
SeriesSN74BCT8374
Datasheet Texas Instruments SN74BCT8374

Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops

Datasheets

Datasheet
TSP

Prices

Status

SN74BCT8374DWSN74BCT8374DWRSN74BCT8374NT
Lifecycle StatusObsolete (Manufacturer has discontinued the production of the device)Obsolete (Manufacturer has discontinued the production of the device)Obsolete (Manufacturer has discontinued the production of the device)
Manufacture's Sample AvailabilityNoNoNo

Packaging

SN74BCT8374DWSN74BCT8374DWRSN74BCT8374NT
N123
Pin242424
Package TypeDWDWNT
Industry STD TermSOICSOICPDIP
JEDEC CodeR-PDSO-GR-PDSO-GR-PDIP-T
Width (mm)7.57.56.73
Length (mm)15.415.431.64
Thickness (mm)2.352.354.57
Pitch (mm)1.271.272.54
Max Height (mm)2.652.655.08
Mechanical DataDownloadDownloadDownload

Eco Plan

SN74BCT8374DWSN74BCT8374DWRSN74BCT8374NT
RoHSNot CompliantNot CompliantNot Compliant
Pb FreeNoNoNo

Model Line

Manufacturer's Classification

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic