SN74LVC2G34-EP
DUAL BUFFER GATE
www.ti.com SCES671 – MARCH 2007 FEATURES (1) Controlled Baseline
– One Assembly Site
– One Test Site
– One Fabrication Site
Extended Temperature Performance of –55°C
to 125В°C
Enhanced Diminishing Manufacturing Sources
(DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree (1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits. Supports 5-V VCC Operation
Inputs Accept Voltages to 5.5 V
Max tpd of 4.1 ns at 3.3 V
Low-Power Consumption, 10-ВµA Max ICC …
