Datasheet Texas Instruments SN74LVTH182512

ManufacturerTexas Instruments
SeriesSN74LVTH182512
Datasheet Texas Instruments SN74LVTH182512

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

Datasheets

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers datasheet
PDF, 735 Kb, Revision: B, File published: Oct 1, 1997
Extract from the document

Prices

Status

SN74LVTH182512DGGR
Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Packaging

SN74LVTH182512DGGR
N1
Pin64
Package TypeDGG
Industry STD TermTSSOP
JEDEC CodeR-PDSO-G
Package QTY2000
CarrierLARGE T&R
Device MarkingLVTH182512
Width (mm)6.1
Length (mm)17
Thickness (mm)1.15
Pitch (mm).5
Max Height (mm)1.2
Mechanical DataDownload

Parametrics

Parameters / ModelsSN74LVTH182512DGGR
SN74LVTH182512DGGR
Bits18
F @ Nom Voltage(Max), Mhz160
ICC @ Nom Voltage(Max), mA24
Operating Temperature Range, C-40 to 85
Output Drive (IOL/IOH)(Max), mA64/-32
Package GroupTSSOP
Package Size: mm2:W x L, PKG64TSSOP: 138 mm2: 8.1 x 17(TSSOP)
RatingCatalog
Technology FamilyLVT
VCC(Max), V3.6
VCC(Min), V2.7
Voltage(Nom), V3.3
tpd @ Nom Voltage(Max), ns5.7

Eco Plan

SN74LVTH182512DGGR
RoHSCompliant

Application Notes

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, File published: Nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, Revision: A, File published: Mar 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, File published: Dec 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.
  • Bus-Hold Circuit
    PDF, 418 Kb, File published: Feb 5, 2001
    When designing systems that include CMOS devices, designers must pay special attention to the operating condition in which all of the bus drivers are in an inactive, high-impedance condition (3-state). Unless special measures are taken, this condition can lead to undefined levels and, thus, to a significant increase in the device?s power dissipation. In extreme cases, this leads to oscillation of

Model Line

Series: SN74LVTH182512 (1)

Manufacturer's Classification

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic