Datasheet Texas Instruments V62/04730-01XE

Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85

Datasheets

PDF, 678 Kb, File published: Nov 10, 2003

Extract from the document

Lifecycle Status	Active (Recommended for new designs)
Manufacture's Sample Availability	No

Bits	18
ICC @ Nom Voltage(Max)	24 mA
Input Type	TTL
Operating Temperature Range	-40 to 85 C
Output Drive (IOL/IOH)(Max)	64/-32 mA
Output Type	TTL
Package Group	TSSOP
Package Size: mm2:W x L	64TSSOP: 138 mm2: 8.1 x 17(TSSOP) PKG
Rating	HiRel Enhanced Product
Technology Family	LVT
VCC(Max)	3.6 V
VCC(Min)	2.7 V
tpd @ Nom Voltage(Max)	5.7 ns

RoHS

Compliant

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LVT Family Characteristics (Rev. A)
PDF, 98 Kb, Revision: A, File published: Mar 1, 1998
To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
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LVT-to-LVTH Conversion
PDF, 84 Kb, File published: Dec 8, 1998
Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.

Series: SN74LVTH182512-EP (2)

Semiconductors > Space & High Reliability > Logic Products > Specialty Logic Products > Boundary Scan (JTAG)

V62/0473001XE, V62/04730 01XE