Datasheet Texas Instruments SN74LVTH18646A
| Manufacturer | Texas Instruments |
| Series | SN74LVTH18646A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
Datasheets
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers datasheet
PDF, 600 Kb, Revision: D, File published: Jun 1, 1997
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Status
| SN74LVTH18646APM | SN74LVTH18646APMG4 | |
|---|---|---|
| Lifecycle Status | Active (Recommended for new designs) | Active (Recommended for new designs) |
| Manufacture's Sample Availability | No | No |
Packaging
| SN74LVTH18646APM | SN74LVTH18646APMG4 | |
|---|---|---|
| N | 1 | 2 |
| Pin | 64 | 64 |
| Package Type | PM | PM |
| Industry STD Term | LQFP | LQFP |
| JEDEC Code | S-PQFP-G | S-PQFP-G |
| Package QTY | 160 | 160 |
| Carrier | JEDEC TRAY (10+1) | JEDEC TRAY (10+1) |
| Device Marking | LVTH18646A | LVTH18646A |
| Width (mm) | 10 | 10 |
| Length (mm) | 10 | 10 |
| Thickness (mm) | 1.4 | 1.4 |
| Pitch (mm) | .5 | .5 |
| Max Height (mm) | 1.6 | 1.6 |
| Mechanical Data | Download | Download |
Parametrics
| Parameters / Models | SN74LVTH18646APM | SN74LVTH18646APMG4 |
|---|---|---|
| Bits | 18 | 18 |
| F @ Nom Voltage(Max), Mhz | 160 | 160 |
| ICC @ Nom Voltage(Max), mA | 24 | 24 |
| Operating Temperature Range, C | -40 to 85 | -40 to 85 |
| Output Drive (IOL/IOH)(Max), mA | 64/-32 | 64/-32 |
| Package Group | LQFP | LQFP |
| Package Size: mm2:W x L, PKG | 64LQFP: 144 mm2: 12 x 12(LQFP) | 64LQFP: 144 mm2: 12 x 12(LQFP) |
| Rating | Catalog | Catalog |
| Technology Family | LVT | LVT |
| VCC(Max), V | 3.6 | 3.6 |
| VCC(Min), V | 2.7 | 2.7 |
| Voltage(Nom), V | 3.3 | 3.3 |
| tpd @ Nom Voltage(Max), ns | 4.7 | 4.7 |
Eco Plan
| SN74LVTH18646APM | SN74LVTH18646APMG4 | |
|---|---|---|
| RoHS | Compliant | Compliant |
Application Notes
- Programming CPLDs Via the 'LVT8986 LASPPDF, 819 Kb, File published: Nov 1, 2005
This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to - LVT Family Characteristics (Rev. A)PDF, 98 Kb, Revision: A, File published: Mar 1, 1998
To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti - LVT-to-LVTH ConversionPDF, 84 Kb, File published: Dec 8, 1998
Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed. - Bus-Hold CircuitPDF, 418 Kb, File published: Feb 5, 2001
When designing systems that include CMOS devices, designers must pay special attention to the operating condition in which all of the bus drivers are in an inactive, high-impedance condition (3-state). Unless special measures are taken, this condition can lead to undefined levels and, thus, to a significant increase in the device?s power dissipation. In extreme cases, this leads to oscillation of
Model Line
Series: SN74LVTH18646A (2)
Manufacturer's Classification
- Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic
