Datasheet MC34071,2,4,A; MC33071,2,4,A; NCV33072,4,A (ON Semiconductor) - 3
| Manufacturer | ON Semiconductor |
| Description | Single Supply 3.0 V to 44 V Operational Amplifiers |
| Pages / Page | 26 / 3 — MC34071,2,4,A MC33071,2,4,A, NCV33072,4,A. MAXIMUM RATINGS. Rating. … |
| Revision | 22 |
| File Format / Size | PDF / 253 Kb |
| Document Language | English |
MC34071,2,4,A MC33071,2,4,A, NCV33072,4,A. MAXIMUM RATINGS. Rating. Symbol. Value. Unit. http://onsemi.com
Model Line for this Datasheet
- MC33072ADG MC33072ADR2 MC33072ADR2G MC33072AP MC33072APG MC33072D MC33072DG MC33072DR2 MC33072DR2G MC33072P MC33072PG NCV33072ADR2G NCV33072DR2G
Text Version of Document
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MC34071,2,4,A MC33071,2,4,A, NCV33072,4,A MAXIMUM RATINGS Rating Symbol Value Unit
Supply Voltage (from VEE to VCC) VS +44 V Input Differential Voltage Range VIDR (Note 1) V Input Voltage Range VIR (Note 1) V Output Short Circuit Duration (Note 2) tSC Indefinite Sec Operating Junction Temperature TJ +150 °C Storage Temperature Range Tstg −60 to +150 °C ESD Capability, Dual and Quad (Note 3) V Human Body Model ESDHBM 2000 Machine Model ESDMM 200 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Either or both input voltages should not exceed the magnitude of VCC or VEE. 2. Power dissipation must be considered to ensure maximum junction temperature (TJ) is not exceeded (see Figure 2). 3. This device series incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per AEC−Q100−002 (JEDEC standard: JESD22−A114) ESD Machine Model tested per AEC−Q100−003 (JEDEC standard: JESD22−A115)
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MC34071,2,4,A MC33071,2,4,A, NCV33072,4,A MAXIMUM RATINGS Rating Symbol Value Unit
Supply Voltage (from VEE to VCC) VS +44 V Input Differential Voltage Range VIDR (Note 1) V Input Voltage Range VIR (Note 1) V Output Short Circuit Duration (Note 2) tSC Indefinite Sec Operating Junction Temperature TJ +150 °C Storage Temperature Range Tstg −60 to +150 °C ESD Capability, Dual and Quad (Note 3) V Human Body Model ESDHBM 2000 Machine Model ESDMM 200 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Either or both input voltages should not exceed the magnitude of VCC or VEE. 2. Power dissipation must be considered to ensure maximum junction temperature (TJ) is not exceeded (see Figure 2). 3. This device series incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per AEC−Q100−002 (JEDEC standard: JESD22−A114) ESD Machine Model tested per AEC−Q100−003 (JEDEC standard: JESD22−A115)
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