Datasheet LTC2222, LTC2223 (Analog Devices) - 3

LTC2222/LTC2223
ELECTRICAL CHARACTERISTICS The
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. LTC2222 LTC2223 PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX UNITS
Resolution (No Missing Codes) l 12 12 Bits Integral Linearity Error (Note 5) Differential Analog Input l –1.3 ±0.3 1.3 –1.1 ±0.3 1.1 LSB Differential Linearity Error Differential Analog Input l –1 ±0.2 1 –0.8 ±0.2 0.8 LSB Integral Linearity Error (Note 5) Single-Ended Analog Input ±1 ±1 LSB Differential Linearity Error Single-Ended Analog Input ±0.2 ±0.2 LSB Offset Error (Note 6) l –30 ±3 30 –30 ±3 30 mV Gain Error External Reference l –2.5 ±0.5 2.5 –2.5 ±0.5 2.5 %FS Offset Drift ±10 ±10 μV/C Full-Scale Drift Internal Reference ±30 ±30 ppm/C External Reference ±15 ±15 ppm/C Transition Noise SENSE = 1V 0.5 0.5 LSBRMS
ANALOG INPUT The
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
V + – IN Analog Input Range (AIN – AIN ) 3.1V < VDD < 3.5V l ±0.5 to ±1 V V + – IN, CM Analog Input Common Mode (AIN + AIN )/2 Differential Input l 1 1.6 1.9 V Single-Ended Input (Note 7) l 0.5 1.6 2.1 V I + – IN Analog Input Leakage Current 0 < AIN , AIN < VDD l –1 1 μA ISENSE SENSE Input Leakage 0V < SENSE < 1V l –1 1 μA IMODE MODE Pin Pull-Down Current to GND 10 μA Full Power Bandwidth Figure 8 Test Circuit 775 MHz tAP Sample and Hold Acquisition Delay Time 0 ns tJITTER Sample and Hold Acquisition Delay Time Jitter 0.15 psRMS CMRR Analog Input Common Mode Rejection Ratio 80 dB 22223fb 3