Datasheet LTC2299 (Analog Devices) - 5
| Manufacturer | Analog Devices |
| Description | Dual 14-Bit, 80Msps Low Power 3V ADC |
| Pages / Page | 24 / 5 — POWER REQUIRE E TS The. denotes the specifications which apply over the … |
| File Format / Size | PDF / 730 Kb |
| Document Language | English |
POWER REQUIRE E TS The. denotes the specifications which apply over the full operating temperature
Model Line for this Datasheet
Text Version of Document
LTC2299
W U POWER REQUIRE E TS The
●
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25
°
C. (Note 8) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VDD Analog Supply Voltage (Note 9) ● 2.7 3 3.4 V OVDD Output Supply Voltage (Note 9) ● 0.5 3 3.6 V IVDD Supply Current Both ADCs at fS(MAX) ● 148 172 mA PDISS Power Dissipation Both ADCs at fS(MAX) ● 444 516 mW PSHDN Shutdown Power (Each Channel) SHDN = H, OE = H, No CLK 2 mW PNAP Nap Mode Power (Each Channel) SHDN = H, OE = L, No CLK 15 mW
W U TI I G CHARACTERISTICS The
●
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25
°
C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fs Sampling Frequency (Note 9) ● 1 80 MHz tL CLK Low Time Duty Cycle Stabilizer Off ● 5.9 6.25 500 ns Duty Cycle Stabilizer On (Note 9) ● 5 6.25 500 ns tH CLK High Time Duty Cycle Stabilizer Off ● 5.9 6.25 500 ns Duty Cycle Stabilizer On (Note 9) ● 5 6.25 500 ns tAP Sample-and-Hold Aperture Delay 0 ns tD CLK to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns tMD MUX to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns Data Access Time After OE↓ CL = 5pF (Note 7) ● 4.3 10 ns BUS Relinquish Time (Note 7) ● 3.3 8.5 ns Pipeline Latency 5 Cycles
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 5:
Integral nonlinearity is defined as the deviation of a code from a may cause permanent damage to the device. Exposure to any Absolute straight line passing through the actual endpoints of the transfer curve. Maximum Rating condition for extended periods may affect device The deviation is measured from the center of the quantization band. reliability and lifetime.
Note 6:
Offset error is the offset voltage measured from –0.5 LSB when
Note 2:
All voltage values are with respect to ground with GND and OGND the output code flickers between 00 0000 0000 0000 and wired together (unless otherwise noted). 11 1111 1111 1111.
Note 3:
When these pin voltages are taken below GND or above VDD, they
Note 7:
Guaranteed by design, not subject to test. will be clamped by internal diodes. This product can handle input currents
Note 8:
VDD = 3V, fSAMPLE = 80MHz, input range = 1VP-P with differential of greater than 100mA below GND or above VDD without latchup. drive. The supply current and power dissipation are the sum total for both
Note 4:
VDD = 3V, fSAMPLE = 80MHz, input range = 2VP-P with differential channels with both channels active. drive, unless otherwise noted.
Note 9:
Recommended operating conditions. 2299fa 5
W U POWER REQUIRE E TS The
●
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25
°
C. (Note 8) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VDD Analog Supply Voltage (Note 9) ● 2.7 3 3.4 V OVDD Output Supply Voltage (Note 9) ● 0.5 3 3.6 V IVDD Supply Current Both ADCs at fS(MAX) ● 148 172 mA PDISS Power Dissipation Both ADCs at fS(MAX) ● 444 516 mW PSHDN Shutdown Power (Each Channel) SHDN = H, OE = H, No CLK 2 mW PNAP Nap Mode Power (Each Channel) SHDN = H, OE = L, No CLK 15 mW
W U TI I G CHARACTERISTICS The
●
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25
°
C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fs Sampling Frequency (Note 9) ● 1 80 MHz tL CLK Low Time Duty Cycle Stabilizer Off ● 5.9 6.25 500 ns Duty Cycle Stabilizer On (Note 9) ● 5 6.25 500 ns tH CLK High Time Duty Cycle Stabilizer Off ● 5.9 6.25 500 ns Duty Cycle Stabilizer On (Note 9) ● 5 6.25 500 ns tAP Sample-and-Hold Aperture Delay 0 ns tD CLK to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns tMD MUX to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns Data Access Time After OE↓ CL = 5pF (Note 7) ● 4.3 10 ns BUS Relinquish Time (Note 7) ● 3.3 8.5 ns Pipeline Latency 5 Cycles
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 5:
Integral nonlinearity is defined as the deviation of a code from a may cause permanent damage to the device. Exposure to any Absolute straight line passing through the actual endpoints of the transfer curve. Maximum Rating condition for extended periods may affect device The deviation is measured from the center of the quantization band. reliability and lifetime.
Note 6:
Offset error is the offset voltage measured from –0.5 LSB when
Note 2:
All voltage values are with respect to ground with GND and OGND the output code flickers between 00 0000 0000 0000 and wired together (unless otherwise noted). 11 1111 1111 1111.
Note 3:
When these pin voltages are taken below GND or above VDD, they
Note 7:
Guaranteed by design, not subject to test. will be clamped by internal diodes. This product can handle input currents
Note 8:
VDD = 3V, fSAMPLE = 80MHz, input range = 1VP-P with differential of greater than 100mA below GND or above VDD without latchup. drive. The supply current and power dissipation are the sum total for both
Note 4:
VDD = 3V, fSAMPLE = 80MHz, input range = 2VP-P with differential channels with both channels active. drive, unless otherwise noted.
Note 9:
Recommended operating conditions. 2299fa 5
