Datasheet AD7888 (Analog Devices) - 4

AD7888 Parameter A Version1 B Version1 Unit Test Condition/Comment
POWER REQUIREMENTS VDD 2.7/5.25 2.7/5.25 V min/max IDD Normal Mode5 (Static) 700 700 µA max Normal Mode (Operational) 700 700 µA typ fSAMPLE = 125 kSPS Using Standby Mode 450 450 µA typ fSAMPLE = 50 kSPS Using Shutdown Mode 80 80 µA typ fSAMPLE = 10 kSPS 12 12 µA typ fSAMPLE = 1 kSPS Standby Mode6 220 220 µA max VDD = 2.7 V to 5.25 V Shutdown Mode6 2 2 µA max VDD = 4.75 V to 5.25 V (0.5 µA typ) 1 1 µA max VDD = 2.7 V to 3.6 V Normal-Mode Power Dissipation 3.5 3.5 mW max VDD = 5 V 2.1 2.1 mW max VDD = 3 V Shutdown Power Dissipation 10 10 µW max VDD = 5 V 3 3 µW max VDD = 3 V Standby Power Dissipation 1 1 mW max VDD = 5 V 600 600 µW max VDD = 3 V NOTES 1Temperature ranges as follows: A Version: –40°C to +105°C; B Version: –40°C to +105°C. 2See Terminology. 3SNR calculation includes distortion and noise components. 4Sample tested @ 25°C to ensure compliance. 5All digital inputs @ GND except CS @ VDD. No load on the digital outputs. Analog inputs @ GND. 6SCLK @ GND when SCLK off. All digital inputs @ GND except for CS @ VDD. No load on the digital outputs. Analog inputs @ GND. Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS1
(TA = 25°C unless otherwise noted) VDD to AGND . –0.3 V to +7 V Analog Input Voltage to AGND . –0.3 V to VDD + 0.3 V Digital Input Voltage to AGND . –0.3 V to VDD + 0.3 V Digital Output Voltage to AGND . –0.3 V to VDD + 0.3 V REFIN/REFOUT to AGND . –0.3 V to VDD + 0.3 V Input Current to Any Pin Except Supplies2 . ± 10 mA Operating Temperature Range Commercial (A Version) . –40°C to +105°C (B Version) . −40°C to +105°C Storage Temperature Range . –65°C to +150°C Junction Temperature . 150°C SOIC, TSSOP Package, Power Dissipation . 450 mW θJA Thermal Impedance . 124.9°C/W (SOIC) . 150.4°C/W (TSSOP) θJC Thermal Impedance . 42.9°C/W (SOIC) . 27.6°C/W (TSSOP) Lead Temperature, Soldering Vapor Phase (60 secs) . 215°C Infrared (15 secs) . 220°C ESD . 1 kV NOTES 1Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. 2Transient currents of up to 100 mA will not cause SCR latch-up.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
WARNING!
accumulate on the human body and test equipment and can discharge without detection. Although the AD7888 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD
ESD SENSITIVE DEVICE
precautions are recommended to avoid performance degradation or loss of functionality. REV. C –3–