Datasheet OP27 (Analog Devices) - 7

TABLE I. Electrical performance characteristics - Continued. Conditions 1/ 2/ 3/ Test Symbol -55C  TA  +125C Group A Device Limits 4/ Unit unless otherwise specified subgroups type Min Max Large signal voltage gain AVO VOUT = 10 V, RL  2 k 1 01 1000 V/mV VOUT = 10 V, RL  600 800 VOUT = 10 V, RL  2 k 2,3 500 VOUT = 10 V, RL  2 k 1 02, 03 1000 M,D,P,L,R 1 02 100 M,D,P,L 1 03 100 VOUT = 10 V, RL  600 1 02, 03 800 VOUT = 10 V, RL  2 k 2,3 600 1/ Device 02 supplied to this drawing have been characterized through all levels M, D, P, L, R of irradiation. Device 03 supplied to this drawing have been characterized through all levels P and L of irradiation. However, device 02 is only tested at the “R” level and device type 03 is only tested at the “L” level. Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C. 2/ Unless otherwise specified, VS = 15 V and source resistance (RS) = 50 . 3/ The 02 device may be low dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A for device type 02. Device type 03, has been tested at low dose rate. 4/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 5/ This parameter is not tested post-irradiation. 6/ Input voltage range is defined as the VCM range used for the CMRR test. 7/ This test shall be 100% tested at preburn-in of interim electrical parameters and guaranteed to the limits specified in table I herein.
STANDARD
SIZE
5962-94680 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 F 7 DSCC FORM 2234 APR 97