Datasheet ADXL312 (Analog Devices) - 4

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Data Sheet ADXL312 SPECIFICATIONS
TA = −40°C to +105°C, VS = VDD I/O = 3.3 V, acceleration = 0 g, unless otherwise noted.
Table 1. Specifications1 Parameter Test Conditions/Comments Min Typ Max Unit
SENSOR INPUT Each axis Measurement Range User selectable ±1.5, 3, 6, 12 g Nonlinearity Percentage of full scale ±0.5 % Inter-Axis Alignment Error ±0.1 Degrees Cross-Axis Sensitivity2 ±1 % OUTPUT RESOLUTION Each axis All g Ranges Default resolution 10 Bits ±1.5 g Range Full resolution enabled 10 Bits ±3 g Range Full resolution enabled 11 Bits ±6 g Range Full resolution enabled 12 Bits ±12 g Range Full resolution enabled 13 Bits SENSITIVITY Each axis Scale Factor at XOUT, YOUT, ZOUT ±1.5 g, 10-bit or full resolution 2.6 2.9 3.2 mg/LSB Scale Factor at XOUT, YOUT, ZOUT ±3 g, 10-bit resolution 5.2 5.8 6.4 mg/LSB Scale Factor at XOUT, YOUT, ZOUT ±6 g, 10-bit resolution 10.4 11.6 12.8 mg/LSB Scale Factor at XOUT, YOUT, ZOUT ±12 g, 10-bit resolution 20.9 23.2 25.5 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±1.5 g, 10-bit or full resolution 312 345 385 LSB/g Sensitivity at XOUT, YOUT, ZOUT ±3 g, 10-bit resolution 156 172 192 LSB/g Sensitivity at XOUT, YOUT, ZOUT ±6 g, 10-bit resolution 78 86 96 LSB/g Sensitivity at XOUT, YOUT, ZOUT ±12 g, 10-bit resolution 39 43 48 LSB/g Sensitivity Change Due to Temperature ±0.01 %/°C 0 g BIAS LEVEL Each axis Initial 0 g Output T = 25°C, XOUT, YOUT −150 +150 mg Initial 0 g Output T = 25°C, ZOUT −250 +250 mg 0 g Output over Temperature −40°C < T < 105°C, XOUT, YOUT, ZOUT −250 +250 mg 0 g Offset Tempco XOUT, YOUT ±0.8 mg/°C 0 g Offset Tempco ZOUT ±1.5 mg/°C NOISE PERFORMANCE Noise Density (X-, Y-axes) 200 340 440 µg/√Hz Noise Density (Z-axis) 200 470 595 µg/√Hz OUTPUT DATA RATE/BANDWIDTH User selectable Measurement Rate3 6.25 3200 Hz SELF-TEST4 Data rate ≥ 100 Hz, 2.0 ≤ VS ≤ 3.6 Output Change in X-Axis 0.20 2.10 g Output Change in Y-Axis −2.10 −0.20 g Output Change in Z-Axis 0.30 3.40 g Rev. B | Page 3 of 32 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Power Sequencing Power Savings Power Modes Autosleep Mode Standby Mode Serial Communications Serial Port I/O Default states SPI Preventing Bus Traffic Errors I2C Interrupts DATA_READY Activity Inactivity Watermark Overrun FIFO Bypass Mode FIFO Mode Stream Mode Trigger Mode Retrieving Data from FIFO Self-Test Register Map Register Definitions Register 0x00—DEVID (Read Only) Register 0x1E, Register 0x1F, Register 0x20—OFSX, OFSY, OFSZ (Read/Write) Register 0x24—THRESH_ACT (Read/Write) Register 0x25—THRESH_INACT (Read/Write) Register 0x26—TIME_INACT (Read/Write) Register 0x27—ACT_INACT_CTL (Read/Write) ACT AC/DC and INACT AC/DC Bits ACT_x Enable Bits and INACT_x Enable Bits Register 0x2C—BW_RATE (Read/Write) LOW_POWER Bit Rate Bits Register 0x2D—POWER_CTL (Read/Write) Link Bit AUTO_SLEEP Bit Measure Bit Sleep Bit Wake-Up Bits Register 0x2E—INT_ENABLE (Read/Write) Register 0x2F—INT_MAP (Read/Write) Register 0x30—INT_SOURCE (Read Only) Register 0x31—DATA_FORMAT (Read/Write) SELF_TEST Bit SPI Bit INT_INVERT Bit FULL_RES Bit Justify Bit Range Bits Register 0x32 to Register 0x37—DATAX0, DATAX1, DATAY0, DATAY1, DATAZ0, DATAZ1 (Read Only) Register 0x38—FIFO_CTL (Read/Write) FIFO_MODE Bits Trigger Bit Samples Bits 0x39—FIFO_STATUS (Read Only) FIFO_TRIG Bit Entries Bits Applications Information Power Supply Decoupling Mechanical Considerations for Mounting Threshold Link Mode Sleep Mode vs. Low Power Mode Using Self-Test Data Formatting of Upper Data Rates Noise Performance Axes of Acceleration Sensitivity Solder Profile Outline Dimensions Ordering Guide Automotive Products