Datasheet ADIS16477 (Analog Devices) - 5

link to page 28 link to page 28 link to page 28 link to page 28 link to page 28
ADIS16477 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit
TEMPERATURE SENSOR Scale Factor Output = 0x0000 at 0°C (±5°C) 0.1 °C/LSB LOGIC INPUTS4 Input Voltage High, VIH 2.0 V Low, VIL 0.8 V RST Pulse Width 1 µs CS Wake-Up Pulse Width 20 µs Input Current Logic 1, IIH VIH = 3.3 V 10 µA Logic 0, IIL VIL = 0 V All Pins Except RST 10 µA RST Pin 0.33 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS Output Voltage High, VOH ISOURCE = 0.5 mA 2.4 V Low, VOL ISINK = 2.0 mA 0.4 V FLASH MEMORY Endurance5 10000 Cycles Data Retention6 TJ = 85°C 20 Years FUNCTIONAL TIMES7 Time until data is available Power-On Start-Up Time 252 ms Reset Recovery Time8 GLOB_CMD, Bit 7 = 1 (see Table 113) 193 ms Factory Calibration Restore GLOB_CMD, Bit 1 = 1 (see Table 113) 142 ms Flash Memory Backup GLOB_CMD, Bit 3 = 1 (see Table 113) 72 ms Flash Memory Test Time GLOB_CMD, Bit 4 = 1 (see Table 113) 32 ms Self Test Time9 GLOB_CMD, Bit 2 = 1 (see Table 113) 14 ms CONVERSION RATE 2000 SPS Initial Clock Accuracy 3 % Sync Input Clock 1.9 2.1 kHz POWER SUPPLY, VDD Operating voltage range 3.0 3.6 V Power Supply Current10 Normal mode, VDD = 3.3 V 44 55 mA 1 This measurement is based on the deviation from a best fit linear model. 2 Bias repeatability provides an estimate for long-term drift in the bias, as observed during 500 hours of high temperature operating life (HTOL) at +105°C. 3 All specifications associated with the accelerometers relate to the ful -scale range of ±8 g, unless otherwise noted. 4 The digital input/output signals use a 3.3 V system. 5 Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C. 6 The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ. 7 These times do not include thermal settling and internal filter response times, which may affect overal accuracy. 8 The RST line must be in a low state for at least 10 μs to ensure a proper reset initiation and recovery. 9 The self test time can extend when using external clock rates lower than 2000 Hz. 10 Power supply current transients can reach 100 mA during initial startup or reset recovery. Rev. A | Page 4 of 33 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings Thermal Resistance ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Introduction Inertial Sensor Signal Chain Gyroscope Data Sampling Accelerometer Data Sampling External Clock Options Inertial Sensor Calibration Bartlett Window FIR Filter Averaging/Decimating Filter Register Structure Serial Peripheral Interface (SPI) Data Ready (DR) Reading Sensor Data Burst Read Function Device Configuration Memory Structure User Register Memory Map User Register Defintions Status/Error Flag Indicators (DIAG_STAT) Gyroscope Data Gyroscope Measurement Range/Scale Factor Gyroscope Data Formatting X-Axis Gyroscope (X_GYRO_LOW and X_GYRO_OUT) Y-Axis Gyroscope (Y_GYRO_LOW and Y_GYRO_OUT) Z-Axis Gyroscope (Z_GYRO_LOW and Z_GYRO_OUT) Acceleration Data Accelerometer Resolution X-Axis Accelerometer (X_ACCL_LOW and X_ACCL_OUT) Y-Axis Accelerometer (Y_ACCL_LOW and Y_ACCL_OUT) Z-Axis Accelerometer (Z_ACCL_LOW and Z_ACCL_OUT) Internal Temperature (TEMP_OUT) Time Stamp (TIME_STAMP) Data Update Counter (DATA_CNTR) Delta Angles Delta Angle Measurement Range X-Axis Delta Angle (X_DELTANG_LOW and X_DELTANG_OUT) Y-Axis Delta Angle (Y_DELTANG_LOW and Y_DELTANG_OUT) Z-Axis Delta Angle (Z_DELTANG_LOW and Z_DELTANG_OUT) Delta Angle Resolution Delta Velocity X-Axis Delta Velocity (X_DELTVEL_LOW and X_DELTVEL_OUT) Y-Axis Delta Velocity (Y_DELTVEL_LOW and Y_DELTVEL_OUT) Z-Axis Delta Velocity (Z_DELTVEL_LOW and Z_DELTVEL_OUT) Delta Velocity Resolution Calibration Calibration, Gyroscope Bias (XG_BIAS_LOW and XG_BIAS_HIGH) Calibration, Gyroscope Bias (YG_BIAS_LOW and YG_BIAS_HIGH) Calibration, Gyroscope Bias (ZG_BIAS_LOW and ZG_BIAS_HIGH) Calibration, Accelerometer Bias (XA_BIAS_LOW and XA_BIAS_HIGH) Calibration, Accelerometer Bias (YA_BIAS_LOW and YA_BIAS_HIGH) Calibration, Accelerometer Bias (ZA_BIAS_LOW and ZA_BIAS_HIGH) Filter Control Register (FILT_CTRL) Range Identifier (RANG_MDL) Miscellaneous Control Register (MSC_CTRL) Point of Percussion Linear Acceleration Effect on Gyroscope Bias Internal Clock Mode Output Sync Mode Direct Sync Mode Pulse Sync Mode Scaled Sync Mode Decimation Filter (DEC_RATE) Data Update Rate in External Sync Modes Continuous Bias Estimation (NULL_CNFG) Global Commands (GLOB_CMD) Software Reset Flash Memory Test Flash Memory Update Sensor Self Test Factory Calibration Restore Bias Correction Update Firmware Revision (FIRM_REV) Firmware Revision Day and Month (FIRM_DM) Firmware Revision Year (FIRM_Y) Product Identification (PROD_ID) Serial Number (SERIAL_NUM) Scratch Registers (USER_SCR_1 to USER_SCR_3) Flash Memory Endurance Counter (FLSHCNT_LOW and FLSHCNT_HIGH) Applications Information Assembly and Handling Tips Package Attributes Assembly Tips PCB Layout Suggestions Underfill Process Validation and Control Power Supply Considerations Evaluation Tools Breakout Boards PC-Based Evaluation, EVAL-ADIS2 Packaging and Ordering Information Outline Dimensions Ordering Guide