Datasheet ADIS16448 (Analog Devices) - 6

ManufacturerAnalog Devices
DescriptionCompact, Precision Ten Degree of Freedom Inertial Sensor
Pages / Page26 / 6 — Data Sheet. ADIS16448. Parameter. Test Conditions/Comments. Min. Typ. …
RevisionH
File Format / SizePDF / 619 Kb
Document LanguageEnglish

Data Sheet. ADIS16448. Parameter. Test Conditions/Comments. Min. Typ. Max. Unit

Data Sheet ADIS16448 Parameter Test Conditions/Comments Min Typ Max Unit

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Data Sheet ADIS16448 Parameter Test Conditions/Comments Min Typ Max Unit
TEMPERATURE Sensitivity See Table 23 0.07386 °C/LSB BAROMETERS Pressure Range, Operating 300 1100 mbar Pressure Range Extended3 10 1200 mbar Sensitivity 0.02 mbar/LSB Voltage Dependence 0.18 %/V Bias Supply Voltage Sensitivity 3.24 mbar/V Total Error 25°C, 300 mbar to 1100 mbar 1.5 mbar Relative Error4 −40°C to +85°C, 300 mbar to 1100 mbar 2.5 mbar Linearity5 25°C, 300 mbar to 1100 mbar 0.1 % of FS −40°C to +85°C, 300 mbar to 1100 mbar 0.2 % of FS Noise 0.08 mbar rms LOGIC INPUTS6 Input High Voltage, VIH 2.0 V Input Low Voltage, VIL 0.8 V Logic 1 Input Current, IIH VIH = 3.3 V ±0.2 ±10 µA Logic 0 Input Current, IIL VIL = 0 V All Pins Except RST 40 60 µA RST Pin 1 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS6 Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V FLASH MEMORY Endurance7 10,000 Cycles Data Retention8 TJ = 85°C 20 Years FUNCTIONAL TIMES9 Time until new data is available Power-On Start-Up Time 205 ms Reset Recovery Time10 90 ms Flash Memory Back-Up Time 75 ms Flash Memory Test Time 20 ms Automatic Self-Test Time SMPL_PRD = 0x0001 45 ms CONVERSION RATE xGYRO_OUT, xACCL_OUT SMPL_PRD = 0x0001 819.2 SPS xMAGN_OUT, BARO_OUT11 SMPL_PRD = 0x0001 51.2 SPS Clock Accuracy ±3 % Sync Input Clock12 0.8 1.1 kHz POWER SUPPLY Operating voltage range, VDD 3.15 3.3 3.45 V Power Supply Current 76 104 mA 1 The repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C to +85°C), electronics drift (high-temperature operating life test: 85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −40°C to +85°C), rate random walk (10 year projection), and broadband noise. 2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications. 3 The extended pressure range is guaranteed by design. 4 The relative error assumes that the initial error, at 25°C, is corrected in the end application. 5 Linearity errors assume a full scale (FS) of 1000 mbar. 6 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 7 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C. 8 The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction temperature. 9 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overal accuracy. 10 The RST line must be held low for at least 10 μs to assure a proper reset and recovery sequence. 11 The xMAGN_OUT and BARO_OUT registers update at a rate that is 1/16th that of the other output registers. 12 The sync input clock functions below the specified minimum value but at reduced performance levels. Rev. F | Page 5 of 25 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS USER REGISTERS USER INTERFACE READING SENSOR DATA Burst Read Function Burst Read Function with CRC SPI Read Test Sequence DEVICE CONFIGURATION Dual Memory Structure OUTPUT DATA REGISTERS GYROSCOPES ACCELEROMETERS MAGNETOMETERS BAROMETRIC PRESSURE REMOTE PRESSURE SENSING INTERNAL TEMPERATURE SYSTEM FUNCTIONS GLOBAL COMMANDS PRODUCT IDENTIFICATION SELF-TEST FUNCTION STATUS/ERROR FLAGS Magnetometer/Barometer New Data Indicator MEMORY MANAGEMENT Checksum Test INPUT/OUTPUT CONFIGURATION DATA READY INDICATOR GENERAL-PURPOSE INPUT/OUTPUT Example Input/Output Configuration DIGITAL PROCESSING CONFIGURATION GYROSCOPES/ACCELEROMETERS INPUT CLOCK CONFIGURATION Digital Filtering Dynamic Range MAGNETOMETER/BAROMETER New Data Indicators CALIBRATION GYROSCOPES Gyroscope Bias Error Estimation Gyroscope Bias Correction Factors Single Command Bias Correction ACCELEROMETERS Accelerometer Bias Error Estimation Accelerometer Bias Correction Factors Point of Percussion Alignment MAGNETOMETER CALIBRATION Hard Iron Correction Hard Iron Factors Soft Iron Effects FLASH UPDATES RESTORING FACTORY CALIBRATION ALARMS STATIC ALARM USE DYNAMIC ALARM USE ALARM REPORTING Alarm Example APPLICATIONS INFORMATION MOUNTING TIPS POWER SUPPLY CONSIDERATIONS ADIS16IMU2/PCBZ PC-BASED EVALUATION TOOLS OUTLINE DIMENSIONS ORDERING GUIDE