Datasheet RH1573K DICE (Analog Devices) - 4
| Manufacturer | Analog Devices |
| Description | Low Dropout PNP Regulator Driver |
| Pages / Page | 4 / 4 — TABLE 4: ELECTRICAL TEST REQUIREMENTS. PDA Test Notes. MIL-STD-883 TEST … |
| File Format / Size | PDF / 69 Kb |
| Document Language | English |
TABLE 4: ELECTRICAL TEST REQUIREMENTS. PDA Test Notes. MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. TOTAL DOSE BIAS CIRCUIT
Model Line for this Datasheet
Text Version of Document
RH1573K DICE
TABLE 4: ELECTRICAL TEST REQUIREMENTS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specifi ed as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3 tests after cooldown as the fi nal electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3 5004 of MIL-STD-883. The verifi ed failures of group A, subgroup 1, after Group B and D for Class S, 1,2,3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
RH1573K W10 FB COMP NC LATCH V 7V OUT NC 20mA SHDN VIN 340Ω 1μF GND DRIVE RH1573 BIAS I.D. No. 66-10-1573 rh1573kdicef 4 Linear Technology Corporation LT 1208 • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2008
TABLE 4: ELECTRICAL TEST REQUIREMENTS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specifi ed as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3 tests after cooldown as the fi nal electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3 5004 of MIL-STD-883. The verifi ed failures of group A, subgroup 1, after Group B and D for Class S, 1,2,3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
RH1573K W10 FB COMP NC LATCH V 7V OUT NC 20mA SHDN VIN 340Ω 1μF GND DRIVE RH1573 BIAS I.D. No. 66-10-1573 rh1573kdicef 4 Linear Technology Corporation LT 1208 • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2008
