Datasheet ADL5304 (Analog Devices) - 4

ManufacturerAnalog Devices
DescriptionHigh Speed, 200 dB Range, Current to Voltage Logarithmic Converter
Pages / Page32 / 4 — ADL5304. Data Sheet. Parameter. Test Conditions/Comments. Min. Typ. Max. …
RevisionA
File Format / SizePDF / 924 Kb
Document LanguageEnglish

ADL5304. Data Sheet. Parameter. Test Conditions/Comments. Min. Typ. Max. Unit

ADL5304 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit

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ADL5304 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit
POWER SUPPLY VPOS, VNEG VPOS 4.5 5.0 5.5 V Quiescent Current INUM = IDEN = 10 µA; VPOS = 5 V, VNEG = 0 V 13.5 16 mA 4.5 V ≤ VPOS ≤ 5.5 V 10 17 mA VNEG6 Nominal 0 V for single supply 0 −5 V Quiescent Current INUM = IDEN = 10 µA; VPOS = 5 V, VNEG = 0 V −8.5 −7.3 mA VNEG = −5 V −10.5 −6 mA 1 Slope is of the same magnitude but opposite sign for input applied to IDEN. 2 IZ = IREF/10(VOFS/VY). Note that the error of IZ is dependent on three parameters, IREF, VOFS, and VY. All three of those are trimmed. 3 Output noise and small signal bandwidth are functions of input current; measured from the INUM input to the VLOG output. See the Typical Performance Characteristics section. 4 High-to-low currents (falling edge) represent the worst-case settling condition. Low-to-high currents (rising edge) settling times are approximately 2× faster than the falling edge settling. Settling time is measured to 1 dB error (10 mV/dB; VLOG settles to within 10 mV of the final value). 5 IREF applied to IDEN together with 1P5V determines the logarithmic intercept current, IZ, and thereby the accuracy of the intercept. 6 Using dual-supply operation with the VSMx, DCBI, and INPS pins at ground, VNEG needs to be in the −2 V to −5 V range for proper device function. Rev. A | Page 4 of 32 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION SIMPLIFIED BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TEST CIRCUITS TERMINOLOGY THEORY OF OPERATION BASIC CONCEPTS OPTICAL MEASUREMENTS Decibel Scaling CIRCUIT DESCRIPTION Bandwidth vs. Current Noise vs. Current Filtering to Improve Noise and Dynamic Behavior Photodiode Bias Reference Outputs Buffer Amplifier Setting the Log Slope and Intercept Slope Inversion Log Ratio Operation APPLICATIONS INFORMATION USING THE ADL5304 Using the Adaptive Bias Summing Node Voltage Leakage VLOG Output Dynamic Response USING A NEGATIVE SUPPLY EVALUATION BOARD SCHEMATIC AND SILKSCREENS OUTLINE DIMENSIONS ORDERING GUIDE