Datasheet RT2378-20 (Analog Devices) - 5
| Manufacturer | Analog Devices |
| Description | Radiation Tolerant 20-Bit, 1Msps, Low Power Plastic Package SAR ADC |
| Pages / Page | 10 / 5 — Dc TiMing characTerisTics The. denotes the specifications which apply … |
| File Format / Size | PDF / 181 Kb |
| Document Language | English |
Dc TiMing characTerisTics The. denotes the specifications which apply over the full operating
Model Line for this Datasheet
Text Version of Document
RT2378-20
a Dc TiMing characTerisTics The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS SUB GROUP MIN TYP MAX UNITS
tDSDO SDO Data Valid Delay from SCK↑ CL = 20pF, OVDD = 5.25V l 9, 10, 11 7.5 ns CL = 20pF, OVDD = 2.5V l 9, 10, 11 8 ns CL = 20pF, OVDD = 1.71V l 9, 10, 11 9.5 ns tHSDO SDO Data Remains Valid Delay from CL = 20pF (Note 10) l 1 ns SCK↑ tDSDOBUSYL SDO Data Valid Delay from BUSY↓ CL = 20pF (Note 10) l 5 ns tEN Bus Enable Time After RDL↓ (Note 11) l 9, 10, 11 16 ns tDIS Bus Relinquish Time After RDL↑ (Note 11) l 9, 10, 11 13 ns
converTer characTerisTics (Post-Irradiation) The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) 10kRAD(SI) SYMBOL PARAMETER CONDITIONS MIN TYP TYP UNITS
INL Integral Linearity Error (Note 6) –3.5 3.5 ppm REF/DGC = GND (Note 6) –3.5 3.5 ppm
ToTal Dose bias circuiT
J1 5V OVDD SDO R3 J5 2.5V 1k 1 16 CHAIN GND E1 2 15 VDD VDD OVDD 3 14 GND SDO J3 4 13 R5, 1k SCK IN+ SCK SCK = GND C2 5 12 R6, 1k 0.1µF IN– RDL/SDI 50V 6 11 GND BUSY 7 10 REF GND J4 8 9 R7, 1k CNV REF/DGC CNV CNV = GND C1 C3 C4 C5 C6 10µF R4 1µF 47µF 20pF 20pF 50V 1k 50V 10V 50V 50V J2 1206 0805 GND RT237820 TDBC01
elecTrical TesT requireMenTs MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from Group A, Final Electrical Test Requirements (Method 5004) 1,* 2, 3, 4, 5, 6, 9, 10, 11 Subgroup 1, tests after cooldown as the final electrical test in Group A Test Requirements (Method 5005) 1, 2, 3, 4, 5, 6, 9, 10, 11 accordance with method 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1, after burn-in divided by the total Group B and D for Class S. 1, 2, 3 number of devices submitted for burn-in in that lot shall be used End Point Electrical Parameters (Method 5005) to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given. rt237820fa For more information www.linear.com 5 Document Outline Features Description Typical Application Absolute Maximum Ratings Pin Configuration Electrical Characteristics Converter Characteristics Dynamic Accuracy Reference Input Digital Inputs and Digital Outputs Power Requirements ADC Timing Characteristics Typical Performance Characteristics
a Dc TiMing characTerisTics The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS SUB GROUP MIN TYP MAX UNITS
tDSDO SDO Data Valid Delay from SCK↑ CL = 20pF, OVDD = 5.25V l 9, 10, 11 7.5 ns CL = 20pF, OVDD = 2.5V l 9, 10, 11 8 ns CL = 20pF, OVDD = 1.71V l 9, 10, 11 9.5 ns tHSDO SDO Data Remains Valid Delay from CL = 20pF (Note 10) l 1 ns SCK↑ tDSDOBUSYL SDO Data Valid Delay from BUSY↓ CL = 20pF (Note 10) l 5 ns tEN Bus Enable Time After RDL↓ (Note 11) l 9, 10, 11 16 ns tDIS Bus Relinquish Time After RDL↑ (Note 11) l 9, 10, 11 13 ns
converTer characTerisTics (Post-Irradiation) The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) 10kRAD(SI) SYMBOL PARAMETER CONDITIONS MIN TYP TYP UNITS
INL Integral Linearity Error (Note 6) –3.5 3.5 ppm REF/DGC = GND (Note 6) –3.5 3.5 ppm
ToTal Dose bias circuiT
J1 5V OVDD SDO R3 J5 2.5V 1k 1 16 CHAIN GND E1 2 15 VDD VDD OVDD 3 14 GND SDO J3 4 13 R5, 1k SCK IN+ SCK SCK = GND C2 5 12 R6, 1k 0.1µF IN– RDL/SDI 50V 6 11 GND BUSY 7 10 REF GND J4 8 9 R7, 1k CNV REF/DGC CNV CNV = GND C1 C3 C4 C5 C6 10µF R4 1µF 47µF 20pF 20pF 50V 1k 50V 10V 50V 50V J2 1206 0805 GND RT237820 TDBC01
elecTrical TesT requireMenTs MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from Group A, Final Electrical Test Requirements (Method 5004) 1,* 2, 3, 4, 5, 6, 9, 10, 11 Subgroup 1, tests after cooldown as the final electrical test in Group A Test Requirements (Method 5005) 1, 2, 3, 4, 5, 6, 9, 10, 11 accordance with method 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1, after burn-in divided by the total Group B and D for Class S. 1, 2, 3 number of devices submitted for burn-in in that lot shall be used End Point Electrical Parameters (Method 5005) to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given. rt237820fa For more information www.linear.com 5 Document Outline Features Description Typical Application Absolute Maximum Ratings Pin Configuration Electrical Characteristics Converter Characteristics Dynamic Accuracy Reference Input Digital Inputs and Digital Outputs Power Requirements ADC Timing Characteristics Typical Performance Characteristics
