Datasheet TB9053FTG,TB9054FTG - Preliminary (Toshiba) - 7
Manufacturer | Toshiba |
Description | Bi-CMOS Linear Integrated Circuit, Silicon Monolithic |
Pages / Page | 36 / 7 — Preliminary. 5.2. DIAG output. Table 5.4 DIAG function (2-channel mode) |
File Format / Size | PDF / 2.2 Mb |
Document Language | English |
Preliminary. 5.2. DIAG output. Table 5.4 DIAG function (2-channel mode)
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Text Version of Document
Preliminary
TB9053FTG,TB9054FTG
5.2. DIAG output
DIAG1 and DIAG2 are open-drain-type output pins. Insert pull-up resistors between these pins and VDDIO (MCU power supply). If no SPI communication is used, connect the VDDIO pin and the external pull-up resistors, that is connected at DIAG1 and DIAG2, to the VCC power supply. When the following faults are detected, these pins outputs L. In the following table, X: Don't Care, H: High, L: Low, and Hiz: High Impedance.
Table 5.4 DIAG function (2-channel mode)
Motor drive output Is EN/ENB pulse input Function EN1 ENB1 EN2 ENB2 DIAG1 DIAG2 needed when DIAG pin pin OUT1 OUT2 OUT3 OUT4 is cleared? Forward (Normal operation) H L H L - H H H L H L Reverse (Normal operation) H L H L - H H L H L H Short brake (Normal operation) H L H L - H H L/H L/H L/H L/H EN1 Disable L X X X No L H/L Hiz Hiz H/L/Hiz H/L/Hiz EN2 Disable X X L X No H/L L H/L/Hiz H/L/Hiz Hiz Hiz ENB1 Disable X H X X No L H/L Hiz Hiz H/L/Hiz H/L/Hiz ENB2 Disable X X X H No H/L L H/L/Hiz H/L/Hiz Hiz Hiz Sleep mode X L/H X L/H - H H Hiz Hiz Hiz Hiz When over-temperature is detected (TSD) X X X X No L L Hiz Hiz Hiz Hiz When Ch1 over-current is detected (ISD) X X X X Yes L H/L Hiz Hiz H/L/Hiz H/L/Hiz When Ch2 over-current is detected (ISD) X X X X Yes H/L L H/L/Hiz H/L/Hiz Hiz Hiz When VBAT under-voltage is detected X X X X No L L Hiz Hiz Hiz Hiz When VCC under-voltage is detected X X X X No L L Hiz Hiz Hiz Hiz When VCC under-voltage is detected (POR) X X X X No L L Hiz Hiz Hiz Hiz When Ch1 open load during operation is detected X X X X No L H/L H/L/Hiz H/L/Hiz H/L/Hiz H/L/Hiz When Ch2 open load during operation is detected X X X X No H/L L H/L/Hiz H/L/Hiz H/L/Hiz H/L/Hiz When Ch1 open load during non- operation is detected H L X X No L H/L H/L/Hiz H/L/Hiz H/L/Hiz H/L/Hiz When Ch2 open load during non- operation is detected X X H L No H/L L H/L/Hiz H/L/Hiz H/L/Hiz H/L/Hiz When initial/restarted diagnosis detects an error (Detection of VBAT/VCC under-voltage or over- X X X X No L L *1 *1 *1 *1 temperature) When Initial/restarted diagnosis detects an error (Detection of Ch1 over-current or open load during X X X X No L H/L *1 *1 *1 *1 operation/non-operation) When Initial/restarted diagnosis detects an error (Detection of Ch2 over-current or open load during X X X X No H/L L *1 *1 *1 *1 operation/non-operation) When initial/restarted diagnosis is attempted but it does not start (Detection of VBAT/VCC under-voltage X X X X No L L Hiz Hiz Hiz Hiz or over-temperature) © 20 20 7 2020-12-10 Toshiba Electronic Devices & Storage Corporation