Datasheet LTC1608 (Analog Devices) - 5
| Manufacturer | Analog Devices |
| Description | High Speed, 16-Bit, 500ksps Sampling A/D Converter with Shutdown |
| Pages / Page | 20 / 5 — ELECTRICAL CHARACTERISTICS. Note 4:. Note 10:. Note 5:. Note 11:. Note … |
| File Format / Size | PDF / 816 Kb |
| Document Language | English |
ELECTRICAL CHARACTERISTICS. Note 4:. Note 10:. Note 5:. Note 11:. Note 12:. Note 6:. Note 13:. Note 7:. Note 14:. Note 8:. Note 9:. Note 15:
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LTC1608
ELECTRICAL CHARACTERISTICS Note 4:
When these pin voltages are taken below V
Note 10:
Signal-to-Noise Ratio (SNR) is measured at 5kHz and distortion SS, they will be clamped by internal diodes. This product can handle input currents greater than is measured at 100kHz. These results are used to calculate Signal-to-Nosie 100mA below V Plus Distortion (SINAD). SS without latchup. These pins are not clamped to VDD.
Note 5:
V
Note 11:
Guaranteed by design, not subject to test. DD = 5V, VSS = – 5V, fSMPL = 500kHz, and t r = tf = 5ns unless otherwise specified.
Note 12:
Recommended operating conditions.
Note 6:
Linearity, offset and full-scale specification apply for a single-
Note 13:
The falling CONVST edge starts a conversion. If CONVST returns ended A + – IN input with AIN grounded. high at a critical point during the conversion it can create small errors. For
Note 7:
Integral nonlinearity is defined as the deviation of a code from a best performance ensure that CONVST returns high either within 250ns straight line passing through the actual endpoints of the transfer curve. after conversion start or after BUSY rises. The deviation is measured from the center of the quantization band.
Note 14:
The acquisition time would go up to 400ns and the conversion
Note 8:
Typical RMS noise at the code transitions. time would go up to 1.8µs. However, the throughput time (acquisition +
Note 9:
Bipolar offset is the offset voltage measured from – 0.5LSB when conversion) is guaranteed by test to be 2µs max. the output code flickers between 0000 0000 0000 0000 and 1111 1111
Note 15:
If RD↓ precedes CS↓, the output enable will be gated by CS↓. 1111 1111.
W U TYPICAL PERFOR A CE CHARACTERISTICS Integral Nonlinearity Differential Nonlinearity S/(N + D) vs Input Frequency vs Output Code vs Output Code and Amplitude
2.0 1.0 100 VIN = 0dB 0.8 1.5 90 0.6 80 1.0 VIN = –20dB 0.4 70 0.5 0.2 60 VIN = –40dB 0 0 50 INL (LSB) DNL (LSB) –0.2 SINAD (dB) 40 –0.5 –0.4 30 –1.0 –0.6 20 –1.5 –0.8 10 –2.0 –1.0 0 –32768 –16384 0 16384 32767 –32768 –16384 0 16384 32767 1k 10k 100k 1M CODE CODE FREQUENCY (Hz) 1608 G01 1608 G02 1608 G03
Signal-to-Noise Ratio Spurious-Free Dynamic Range vs Input Frequency Distortion vs Input Frequency vs Input Frequency
100 0 0 90 –10 –10 80 –20 –20 70 –30 –30 –40 –40 60 –50 –50 50 –60 –60 40 –70 –70 30 –80 THD –80 SIGNAL-TO-NOISE RATIO (dB) 20 3RD –90 2ND –90 10 –100 SPURIOUS-FREE DYNAMIC RANGE (dB) –100 AMPLITUDE (dB BELOW THE FUNDAMENTAL) 0 –110 –110 1k 10k 100k 1M 1k 10k 100k 1M 1k 10k 100k 1M FREQUENCY (Hz) INPUT FREQUENCY (Hz) INPUT FREQUENCY (Hz) 1608 G04 1608 G05 1608 G06 5
ELECTRICAL CHARACTERISTICS Note 4:
When these pin voltages are taken below V
Note 10:
Signal-to-Noise Ratio (SNR) is measured at 5kHz and distortion SS, they will be clamped by internal diodes. This product can handle input currents greater than is measured at 100kHz. These results are used to calculate Signal-to-Nosie 100mA below V Plus Distortion (SINAD). SS without latchup. These pins are not clamped to VDD.
Note 5:
V
Note 11:
Guaranteed by design, not subject to test. DD = 5V, VSS = – 5V, fSMPL = 500kHz, and t r = tf = 5ns unless otherwise specified.
Note 12:
Recommended operating conditions.
Note 6:
Linearity, offset and full-scale specification apply for a single-
Note 13:
The falling CONVST edge starts a conversion. If CONVST returns ended A + – IN input with AIN grounded. high at a critical point during the conversion it can create small errors. For
Note 7:
Integral nonlinearity is defined as the deviation of a code from a best performance ensure that CONVST returns high either within 250ns straight line passing through the actual endpoints of the transfer curve. after conversion start or after BUSY rises. The deviation is measured from the center of the quantization band.
Note 14:
The acquisition time would go up to 400ns and the conversion
Note 8:
Typical RMS noise at the code transitions. time would go up to 1.8µs. However, the throughput time (acquisition +
Note 9:
Bipolar offset is the offset voltage measured from – 0.5LSB when conversion) is guaranteed by test to be 2µs max. the output code flickers between 0000 0000 0000 0000 and 1111 1111
Note 15:
If RD↓ precedes CS↓, the output enable will be gated by CS↓. 1111 1111.
W U TYPICAL PERFOR A CE CHARACTERISTICS Integral Nonlinearity Differential Nonlinearity S/(N + D) vs Input Frequency vs Output Code vs Output Code and Amplitude
2.0 1.0 100 VIN = 0dB 0.8 1.5 90 0.6 80 1.0 VIN = –20dB 0.4 70 0.5 0.2 60 VIN = –40dB 0 0 50 INL (LSB) DNL (LSB) –0.2 SINAD (dB) 40 –0.5 –0.4 30 –1.0 –0.6 20 –1.5 –0.8 10 –2.0 –1.0 0 –32768 –16384 0 16384 32767 –32768 –16384 0 16384 32767 1k 10k 100k 1M CODE CODE FREQUENCY (Hz) 1608 G01 1608 G02 1608 G03
Signal-to-Noise Ratio Spurious-Free Dynamic Range vs Input Frequency Distortion vs Input Frequency vs Input Frequency
100 0 0 90 –10 –10 80 –20 –20 70 –30 –30 –40 –40 60 –50 –50 50 –60 –60 40 –70 –70 30 –80 THD –80 SIGNAL-TO-NOISE RATIO (dB) 20 3RD –90 2ND –90 10 –100 SPURIOUS-FREE DYNAMIC RANGE (dB) –100 AMPLITUDE (dB BELOW THE FUNDAMENTAL) 0 –110 –110 1k 10k 100k 1M 1k 10k 100k 1M 1k 10k 100k 1M FREQUENCY (Hz) INPUT FREQUENCY (Hz) INPUT FREQUENCY (Hz) 1608 G04 1608 G05 1608 G06 5
