Datasheet LTC2217 (Analog Devices) - 7
| Manufacturer | Analog Devices |
| Description | 16-Bit, 105Msps Low Noise ADC |
| Pages / Page | 32 / 7 — ELECTRICAL CHARACTERISTICS. Note 1:. Note 5:. Note 6:. Note 2:. Note 3:. … |
| File Format / Size | PDF / 1.3 Mb |
| Document Language | English |
ELECTRICAL CHARACTERISTICS. Note 1:. Note 5:. Note 6:. Note 2:. Note 3:. Note 7:. Note 8:. Note 4:. TIMING DIAGRAM. LVDS Output Mode Timing
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Text Version of Document
LTC2217
ELECTRICAL CHARACTERISTICS Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 5:
Integral nonlinearity is defi ned as the deviation of a code from a “best may cause permanent damage to the device. Exposure to any Absolute fi t straight line” to the transfer curve. The deviation is measured from the Maximum Rating condition for extended periods may affect device center of the quantization band. reliability and lifetime.
Note 6:
Offset error is the offset voltage measured from –1/2LSB when the
Note 2:
All voltage values are with respect to GND, with GND and OGND output code fl ickers between 0000 0000 0000 0000 and 1111 1111 1111 shorted (unless otherwise noted). 1111 in 2’s complement output mode.
Note 3:
When these pin voltages are taken below GND or above VDD, they
Note 7:
Guaranteed by design, not subject to test. will be clamped by internal diodes. This product can handle input currents
Note 8:
Recommended operating conditions. of greater than 100mA below GND or above VDD without latchup.
Note 4:
VDD = 3.3V, fSAMPLE = 105MHz, LVDS outputs, differential ENC+/ ENC– = 2VP-P sine wave with 1.6V common mode, input range = 2.75VP-P with differential drive, unless otherwise specifi ed.
TIMING DIAGRAM LVDS Output Mode Timing All Outputs are Differential and Have LVDS Levels
tAP N + 1 N + 4 ANALOG INPUT N N + 3 N + 2 tH tL ENC– ENC+ tD D0-D15, OF N – 7 N – 6 N – 5 N – 4 N – 3 tC CLKOUT+ CLKOUT – 2217 TD01 2217f 7
ELECTRICAL CHARACTERISTICS Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 5:
Integral nonlinearity is defi ned as the deviation of a code from a “best may cause permanent damage to the device. Exposure to any Absolute fi t straight line” to the transfer curve. The deviation is measured from the Maximum Rating condition for extended periods may affect device center of the quantization band. reliability and lifetime.
Note 6:
Offset error is the offset voltage measured from –1/2LSB when the
Note 2:
All voltage values are with respect to GND, with GND and OGND output code fl ickers between 0000 0000 0000 0000 and 1111 1111 1111 shorted (unless otherwise noted). 1111 in 2’s complement output mode.
Note 3:
When these pin voltages are taken below GND or above VDD, they
Note 7:
Guaranteed by design, not subject to test. will be clamped by internal diodes. This product can handle input currents
Note 8:
Recommended operating conditions. of greater than 100mA below GND or above VDD without latchup.
Note 4:
VDD = 3.3V, fSAMPLE = 105MHz, LVDS outputs, differential ENC+/ ENC– = 2VP-P sine wave with 1.6V common mode, input range = 2.75VP-P with differential drive, unless otherwise specifi ed.
TIMING DIAGRAM LVDS Output Mode Timing All Outputs are Differential and Have LVDS Levels
tAP N + 1 N + 4 ANALOG INPUT N N + 3 N + 2 tH tL ENC– ENC+ tD D0-D15, OF N – 7 N – 6 N – 5 N – 4 N – 3 tC CLKOUT+ CLKOUT – 2217 TD01 2217f 7
