Datasheet ADXL343 (Analog Devices) - 4
| Manufacturer | Analog Devices |
| Description | 3-Axis, ±2 g/±4 g/±8 g/±16 g Digital Accelerometer |
| Pages / Page | 37 / 4 — Data Sheet. ADXL343. SPECIFICATIONS. Table 1. Parameter. Test … |
| File Format / Size | PDF / 651 Kb |
| Document Language | English |
Data Sheet. ADXL343. SPECIFICATIONS. Table 1. Parameter. Test Conditions/Comments. Min. Typ1. Max. Unit
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Data Sheet ADXL343 SPECIFICATIONS
TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V, acceleration = 0 g, CS = 10 µF tantalum, CI/O = 0.1 µF, output data rate (ODR) = 800 Hz, unless otherwise noted. Al minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
Table 1. Parameter Test Conditions/Comments Min Typ1 Max Unit
SENSOR INPUT Each axis Measurement Range User selectable ±2, ±4, ±8, ±16 g Nonlinearity Percentage of full scale ±0.5 % Inter-Axis Alignment Error ±0.1 Degrees Cross-Axis Sensitivity2 ±1 % OUTPUT RESOLUTION Each axis All g Ranges 10-bit resolution 10 Bits ±2 g Range Full resolution 10 Bits ±4 g Range Full resolution 11 Bits ±8 g Range Full resolution 12 Bits ±16 g Range Full resolution 13 Bits SENSITIVITY Each axis Sensitivity at XOUT, YOUT, ZOUT All g ranges, full resolution 256 LSB/g ±2 g, 10-bit resolution 256 LSB/g ±4 g, 10-bit resolution 128 LSB/g ±8 g, 10-bit resolution 64 LSB/g ±16 g, 10-bit resolution 32 LSB/g Sensitivity Deviation from Ideal All g ranges ±1.0 % Scale Factor at XOUT, YOUT, ZOUT All g ranges, full resolution 3.9 mg/LSB ±2 g, 10-bit resolution 3.9 mg/LSB ±4 g, 10-bit resolution 7.8 mg/LSB ±8 g, 10-bit resolution 15.6 mg/LSB ±16 g, 10-bit resolution 31.2 mg/LSB Sensitivity Change Due to Temperature ±0.01 %/°C 0 g OFFSET Each axis 0 g Output Deviation from Ideal, X-, Y-, Z-Axes ±35 mg 0 g Offset vs. Temperature for X-, Y-, Z-Axes ±0.8 mg/°C NOISE X-, Y-, Z-Axes ODR = 100 Hz for ±2 g, 10-bit resolution 1.1 LSB rms or all g-ranges, ful resolution OUTPUT DATA RATE AND BANDWIDTH User selectable Output Data Rate (ODR)3, 4, 5 0.1 3200 Hz SELF-TEST6 Output Change in X-Axis 0.20 2.10 g Output Change in Y-Axis −2.10 −0.20 g Output Change in Z-Axis 0.30 3.40 g POWER SUPPLY Operating Voltage Range (VS) 2.0 2.5 3.6 V Interface Voltage Range (VDD I/O) 1.7 1.8 VS V Supply Current ODR ≥ 100 Hz 140 µA ODR < 10 Hz 30 µA Standby Mode Leakage Current 0.1 µA Turn-On and Wake-Up Time7 ODR = 3200 Hz 1.4 ms Rev. 0 | Page 3 of 36 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance Package Information ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Power Sequencing Power Savings Power Modes Auto Sleep Mode Standby Mode Serial Communications SPI Preventing Bus Traffic Errors I2C Interrupts DATA_READY SINGLE_TAP DOUBLE_TAP Activity Inactivity FREE_FALL Watermark Overrun FIFO Bypass Mode FIFO Mode Stream Mode Trigger Mode Retrieving Data from FIFO Self-Test Register Map Register Definitions Register 0x00—DEVID (Read Only) Register 0x1D—THRESH_TAP (Read/Write) Register 0x1E, Register 0x1F, Register 0x20—OFSX, OFSY, OFSZ (Read/Write) Register 0x21—DUR (Read/Write) Register 0x22—Latent (Read/Write) Register 0x23—Window (Read/Write) Register 0x24—THRESH_ACT (Read/Write) Register 0x25—THRESH_INACT (Read/Write) Register 0x26—TIME_INACT (Read/Write) Register 0x27—ACT_INACT_CTL (Read/Write) ACT AC/DC and INACT AC/DC Bits ACT_x Enable Bits and INACT_x Enable Bits Register 0x28—THRESH_FF (Read/Write) Register 0x29—TIME_FF (Read/Write) Register 0x2A—TAP_AXES (Read/Write) Suppress Bit TAP_x Enable Bits Register 0x2B—ACT_TAP_STATUS (Read Only) ACT_x Source and TAP_x Source Bits Asleep Bit Register 0x2C—BW_RATE (Read/Write) LOW_POWER Bit Rate Bits Register 0x2D—POWER_CTL (Read/Write) Link Bit AUTO_SLEEP Bit Measure Bit Sleep Bit Wakeup Bits Register 0x2E—INT_ENABLE (Read/Write) Register 0x2F—INT_MAP (Read/Write) Register 0x30—INT_SOURCE (Read Only) Register 0x31—DATA_FORMAT (Read/Write) SELF_TEST Bit SPI Bit INT_INVERT Bit FULL_RES Bit Justify Bit Range Bits Register 0x32 to Register 0x37—DATAX0, DATAX1, DATAY0, DATAY1, DATAZ0, DATAZ1 (Read Only) Register 0x38—FIFO_CTL (Read/Write) FIFO_MODE Bits Trigger Bit Samples Bits 0x39—FIFO_STATUS (Read Only) FIFO_TRIG Bit Entries Bits Applications Information Power Supply Decoupling Mechanical Considerations for Mounting Tap Detection Threshold Link Mode Sleep Mode vs. Low Power Mode Offset Calibration Using Self-Test Data Formatting of Upper Data Rates Noise Performance Operation at Voltages Other Than 2.5 V Offset Performance at Lowest Data Rates Axes of Acceleration Sensitivity Layout and Design Recommendations Outline Dimensions Ordering Guide
Data Sheet ADXL343 SPECIFICATIONS
TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V, acceleration = 0 g, CS = 10 µF tantalum, CI/O = 0.1 µF, output data rate (ODR) = 800 Hz, unless otherwise noted. Al minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
Table 1. Parameter Test Conditions/Comments Min Typ1 Max Unit
SENSOR INPUT Each axis Measurement Range User selectable ±2, ±4, ±8, ±16 g Nonlinearity Percentage of full scale ±0.5 % Inter-Axis Alignment Error ±0.1 Degrees Cross-Axis Sensitivity2 ±1 % OUTPUT RESOLUTION Each axis All g Ranges 10-bit resolution 10 Bits ±2 g Range Full resolution 10 Bits ±4 g Range Full resolution 11 Bits ±8 g Range Full resolution 12 Bits ±16 g Range Full resolution 13 Bits SENSITIVITY Each axis Sensitivity at XOUT, YOUT, ZOUT All g ranges, full resolution 256 LSB/g ±2 g, 10-bit resolution 256 LSB/g ±4 g, 10-bit resolution 128 LSB/g ±8 g, 10-bit resolution 64 LSB/g ±16 g, 10-bit resolution 32 LSB/g Sensitivity Deviation from Ideal All g ranges ±1.0 % Scale Factor at XOUT, YOUT, ZOUT All g ranges, full resolution 3.9 mg/LSB ±2 g, 10-bit resolution 3.9 mg/LSB ±4 g, 10-bit resolution 7.8 mg/LSB ±8 g, 10-bit resolution 15.6 mg/LSB ±16 g, 10-bit resolution 31.2 mg/LSB Sensitivity Change Due to Temperature ±0.01 %/°C 0 g OFFSET Each axis 0 g Output Deviation from Ideal, X-, Y-, Z-Axes ±35 mg 0 g Offset vs. Temperature for X-, Y-, Z-Axes ±0.8 mg/°C NOISE X-, Y-, Z-Axes ODR = 100 Hz for ±2 g, 10-bit resolution 1.1 LSB rms or all g-ranges, ful resolution OUTPUT DATA RATE AND BANDWIDTH User selectable Output Data Rate (ODR)3, 4, 5 0.1 3200 Hz SELF-TEST6 Output Change in X-Axis 0.20 2.10 g Output Change in Y-Axis −2.10 −0.20 g Output Change in Z-Axis 0.30 3.40 g POWER SUPPLY Operating Voltage Range (VS) 2.0 2.5 3.6 V Interface Voltage Range (VDD I/O) 1.7 1.8 VS V Supply Current ODR ≥ 100 Hz 140 µA ODR < 10 Hz 30 µA Standby Mode Leakage Current 0.1 µA Turn-On and Wake-Up Time7 ODR = 3200 Hz 1.4 ms Rev. 0 | Page 3 of 36 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance Package Information ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Power Sequencing Power Savings Power Modes Auto Sleep Mode Standby Mode Serial Communications SPI Preventing Bus Traffic Errors I2C Interrupts DATA_READY SINGLE_TAP DOUBLE_TAP Activity Inactivity FREE_FALL Watermark Overrun FIFO Bypass Mode FIFO Mode Stream Mode Trigger Mode Retrieving Data from FIFO Self-Test Register Map Register Definitions Register 0x00—DEVID (Read Only) Register 0x1D—THRESH_TAP (Read/Write) Register 0x1E, Register 0x1F, Register 0x20—OFSX, OFSY, OFSZ (Read/Write) Register 0x21—DUR (Read/Write) Register 0x22—Latent (Read/Write) Register 0x23—Window (Read/Write) Register 0x24—THRESH_ACT (Read/Write) Register 0x25—THRESH_INACT (Read/Write) Register 0x26—TIME_INACT (Read/Write) Register 0x27—ACT_INACT_CTL (Read/Write) ACT AC/DC and INACT AC/DC Bits ACT_x Enable Bits and INACT_x Enable Bits Register 0x28—THRESH_FF (Read/Write) Register 0x29—TIME_FF (Read/Write) Register 0x2A—TAP_AXES (Read/Write) Suppress Bit TAP_x Enable Bits Register 0x2B—ACT_TAP_STATUS (Read Only) ACT_x Source and TAP_x Source Bits Asleep Bit Register 0x2C—BW_RATE (Read/Write) LOW_POWER Bit Rate Bits Register 0x2D—POWER_CTL (Read/Write) Link Bit AUTO_SLEEP Bit Measure Bit Sleep Bit Wakeup Bits Register 0x2E—INT_ENABLE (Read/Write) Register 0x2F—INT_MAP (Read/Write) Register 0x30—INT_SOURCE (Read Only) Register 0x31—DATA_FORMAT (Read/Write) SELF_TEST Bit SPI Bit INT_INVERT Bit FULL_RES Bit Justify Bit Range Bits Register 0x32 to Register 0x37—DATAX0, DATAX1, DATAY0, DATAY1, DATAZ0, DATAZ1 (Read Only) Register 0x38—FIFO_CTL (Read/Write) FIFO_MODE Bits Trigger Bit Samples Bits 0x39—FIFO_STATUS (Read Only) FIFO_TRIG Bit Entries Bits Applications Information Power Supply Decoupling Mechanical Considerations for Mounting Tap Detection Threshold Link Mode Sleep Mode vs. Low Power Mode Offset Calibration Using Self-Test Data Formatting of Upper Data Rates Noise Performance Operation at Voltages Other Than 2.5 V Offset Performance at Lowest Data Rates Axes of Acceleration Sensitivity Layout and Design Recommendations Outline Dimensions Ordering Guide
