Datasheet ADIS16488A (Analog Devices) - 5

ManufacturerAnalog Devices
DescriptionTactical Grade, Ten Degrees of Freedom Inertial Sensor
Pages / Page36 / 5 — Data Sheet. ADIS16488A. Parameter. Test Conditions/Comments. Min. Typ. …
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File Format / SizePDF / 977 Kb
Document LanguageEnglish

Data Sheet. ADIS16488A. Parameter. Test Conditions/Comments. Min. Typ. Max. Unit

Data Sheet ADIS16488A Parameter Test Conditions/Comments Min Typ Max Unit

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Data Sheet ADIS16488A Parameter Test Conditions/Comments Min Typ Max Unit
Total Error 4.5 mbar Relative Error 3 −40°C ≤ TC ≤ +85°C 2.5 mbar Nonlinearity 4 Best fit straight line, FS = 1100 mbar 0.1 % of FS −40°C ≤ TC ≤ +85°C 0.2 % of FS Linear-g Sensitivity ±1 g, 1 σ 0.005 mbar/g Noise 0.025 mbar rms TEMPERATURE SENSOR Scale Factor Output = 0x0000 at 25°C (±5°C) 0.00565 °C/LSB LOGIC INPUTS5 Input High Voltage, VIH 2.0 V Input Low Voltage, VIL 0.8 V E CS Wake-Up Pulse Width 20 µs A Logic 1 Input Current, IIH VIH = 3.3 V 10 µA Logic 0 Input Current, IIL VIL = 0 V All Pins Except RSTE and CSE 10 µA A A A RSTE and CSE Pins6 0.33 mA A A A A 5F Input Capacitance, CIN 10 pF DIGITAL OUTPUTS Output High Voltage, VOH ISOURCE = 0.5 mA 2.4 V Output Low Voltage, VOL ISINK = 2.0 mA 0.4 V FLASH MEMORY Endurance7 100,000 Cycles 6F Data Retention8 TJ = 85°C 20 Years 7F FUNCTIONAL TIMES9 Time until data is available 8F Power-On Start-Up Time 500 ms Reset Recovery Time10 500 ms 9F Sleep Mode Recovery Time 500 µs Flash Memory Update Time 375 ms Test Time 50 ms Automatic Self Test Time Using internal clock, 100 SPS 12 ms CONVERSION RATE 2.46 kSPS Initial Clock Accuracy 0.02 % Temperature Coefficient 40 ppm/°C Sync Input Clock 0.711 2.4 kHz 10F POWER SUPPLY, VDD Operating voltage range 3.0 3.6 V Power Supply Current12 Normal mode, VDD = 3.3 V, µ ± σ 245 mA 11F Sleep mode, VDD = 3.3 V 12.2 mA Power-down mode, VDD = 3.3 V 45 µA POWER SUPPLY, VDDRTC Operating voltage range 3.0 3.6 V Real-Time Clock Supply Current Normal mode, VDDRTC = 3.3 V 13 µA 1 The repeatability specifications represent analytical projections based on the following drift contributions and conditions: temperature hysteresis (−40°C to +85°C), electronics drift (high temperature operating life test: +110°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −55°C to +85°C), rate random walk (10-year projection), and broadband noise. 2 Bias repeatability describes a long-term behavior over a variety of conditions. Short-term repeatability relates to the in-run bias stability and noise density specifications. 3 The relative error assumes that the initial error, at 25°C, is corrected in the end application. 4 Specification assumes a ful scale (FS) of 1000 mbar. 5 The digital input/output signals use a 3.3 V system. 6 RST and CS pins are connected to the VDD pin through 10 kΩ pul -up resistors. 7 Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C. 8 The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ. 9 These times do not include thermal settling and internal filter response times, which may affect overal accuracy. 10 The RST line must be in a low state for at least 10 μs to assure a proper reset initiation and recovery. 11 Device functions at clock rates below 0.7 kHz, but at reduced performance levels. 12 Supply current transients can reach 600 mA during initial start up or reset recovery. Rev. E | Page 5 of 36 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings Thermal Resistance ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Register Structure SPI Communication Device Configuration Dual Memory Structure Reading Sensor Data User Registers Output Data Registers Inertial Sensor Data Format Rotation Rate (Gyroscope) Acceleration Delta Angles Delta Velocity Magnetometers Barometer Internal Temperature Status/Alarm Indicators Firmware Revision Product Identification Digital Signal Processing Gyroscopes/Accelerometers Averaging/Decimation Filter Magnetometer/Barometer FIR Filter Banks Filter Memory Organization Default Filter Performance Calibration Gyroscopes Manual Bias Correction Bias Null Command Manual Sensitivity Correction Linear Acceleration on Effect on Gyroscope Bias Accelerometers Manual Bias Correction Manual Sensitivity Correction Magnetometers Hard Iron Correction Soft Iron Correction Matrix Barometers Restoring Factory Calibration Point of Percussion Alignment Alarms Static Alarm Use Static Alarm Polarity Controls Dynamic Alarm Use Alarm Example System Controls Global Commands Software Reset Automatic Self-Test Memory Management Flash Memory Test General-Purpose Input/Output Data-Ready Indicator Input Sync/Clock Control General-Purpose Input/Output Control Power Management General-Purpose Registers Real-Time Clock Configuration/Data Applications Information Mounting Best Practices Evaluation Tools Breakout Board, ADIS16IMU1/PCBZ PC-Based Evaluation, EVAL-ADIS2 Power Supply Considerations Outline Dimensions Ordering Guide