Datasheet ADIS16364 (Analog Devices) - 7
| Manufacturer | Analog Devices |
| Description | Six Degrees of Freedom Inertial Sensor |
| Pages / Page | 21 / 7 — ADIS16364. Data Sheet. ABSOLUTE MAXIMUM RATINGS Table 3. Parameter. … |
| Revision | F |
| File Format / Size | PDF / 397 Kb |
| Document Language | English |
ADIS16364. Data Sheet. ABSOLUTE MAXIMUM RATINGS Table 3. Parameter. Rating. Table 4. Package Characteristics. Package Type
Model Line for this Datasheet
Text Version of Document
link to page 7 link to page 7
ADIS16364 Data Sheet ABSOLUTE MAXIMUM RATINGS Table 3.
Stresses above those listed under Absolute Maximum Ratings
Parameter Rating
may cause permanent damage to the device. This is a stress Acceleration rating only; functional operation of the device at these or any Any Axis, Unpowered 2000 g other conditions above those indicated in the operational Any Axis, Powered 2000 g section of this specification is not implied. Exposure to absolute VCC to GND −0.3 V to +6.0 V maximum rating conditions for extended periods may affect Digital Input Voltage to GND −0.3 V to +5.3 V device reliability. Digital Output Voltage to GND −0.3 V to VCC + 0.3 V
Table 4. Package Characteristics
Analog Input to GND −0.3 V to +3.6 V
Package Type θ θ Device Weight
Operating Temperature Range −40°C to +105°C
JA JC
Storage Temperature Range −65°C to +125°C1, 2 24-Lead Module 39.8°C/W 14.2°C/W 16 grams (ML-24-2) 1 Extended exposure to temperatures outside the specified temperature range of −40°C to +105°C can adversely affect the accuracy of the factory calibration. For best accuracy, store the parts within the specified operating range of −40°C to +105°C.
ESD CAUTION
2 Although the device is capable of withstanding short-term exposure to 150°C, long-term exposure threatens internal mechanical integrity. Rev. E | Page 6 of 20 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Basic Operation Reading Sensor Data Device Configuration Memory Map Burst Read Data Collection Output Data Registers Calibration Manual Bias Calibration Gyroscope Automatic Bias Null Calibration Gyroscope Precision Automatic Bias Null Calibration Restoring Factory Calibration Linear Acceleration Bias Compensation (Gyroscope) Operational Control Global Commands Internal Sample Rate Power Management Sensor Bandwidth Digital Filtering Dynamic Range Input/Output Functions General-Purpose I/O Input Clock Configuration Data Ready I/O Indicator Auxiliary DAC Diagnostics Self-Test Memory Test Status Alarm Registers Product Identification Applications Information Installation/Handling Gyroscope Bias Optimization Input ADC Channel Interface Printed Circuit Board (PCB) Outline Dimensions Ordering Guide
ADIS16364 Data Sheet ABSOLUTE MAXIMUM RATINGS Table 3.
Stresses above those listed under Absolute Maximum Ratings
Parameter Rating
may cause permanent damage to the device. This is a stress Acceleration rating only; functional operation of the device at these or any Any Axis, Unpowered 2000 g other conditions above those indicated in the operational Any Axis, Powered 2000 g section of this specification is not implied. Exposure to absolute VCC to GND −0.3 V to +6.0 V maximum rating conditions for extended periods may affect Digital Input Voltage to GND −0.3 V to +5.3 V device reliability. Digital Output Voltage to GND −0.3 V to VCC + 0.3 V
Table 4. Package Characteristics
Analog Input to GND −0.3 V to +3.6 V
Package Type θ θ Device Weight
Operating Temperature Range −40°C to +105°C
JA JC
Storage Temperature Range −65°C to +125°C1, 2 24-Lead Module 39.8°C/W 14.2°C/W 16 grams (ML-24-2) 1 Extended exposure to temperatures outside the specified temperature range of −40°C to +105°C can adversely affect the accuracy of the factory calibration. For best accuracy, store the parts within the specified operating range of −40°C to +105°C.
ESD CAUTION
2 Although the device is capable of withstanding short-term exposure to 150°C, long-term exposure threatens internal mechanical integrity. Rev. E | Page 6 of 20 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Basic Operation Reading Sensor Data Device Configuration Memory Map Burst Read Data Collection Output Data Registers Calibration Manual Bias Calibration Gyroscope Automatic Bias Null Calibration Gyroscope Precision Automatic Bias Null Calibration Restoring Factory Calibration Linear Acceleration Bias Compensation (Gyroscope) Operational Control Global Commands Internal Sample Rate Power Management Sensor Bandwidth Digital Filtering Dynamic Range Input/Output Functions General-Purpose I/O Input Clock Configuration Data Ready I/O Indicator Auxiliary DAC Diagnostics Self-Test Memory Test Status Alarm Registers Product Identification Applications Information Installation/Handling Gyroscope Bias Optimization Input ADC Channel Interface Printed Circuit Board (PCB) Outline Dimensions Ordering Guide
