Datasheet AD847 (Analog Devices) - 8

TABLE I. Electrical performance characteristics – Continued. Conditions 1/ Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits 2/ Unit unless otherwise specified subgroups type Min Max Rise time 4/ 8/ t 4,5,6 01 10 ns r VOUT = 0 V to +200 mV, AV = +1, RL = 1 kΩ, VS = ±15 V Fall time 4/ 8/ t 4,5,6 01 10 ns f VOUT = 0 V to -200 mV, AV = +1, RL = 1 kΩ, VS = ±15 V Settling time 4/ t 4 01 150 ns s AV = -1 V/V, RL = 1 kΩ, VS = ±15 V, TA = +25°C, 10 V step at 0.1% of the fixed value A 200 V = -1 V/V, RL = 1 kΩ, VS = ±15 V, TA = +25°C, 10 V step at 0.01% of the fixed value Overshoot 4/ +OS V 4 01 30 % OUT = 0 V to +200 mV, AV = +1, RL = 1 kΩ, VS = ±15 V, TA = +25°C -OS V 30 OUT = 0 V to -200 mV, AV = +1, RL = 1 kΩ, VS = ±15 V, TA = +25°C 1/ Unless otherwise specified, for dc tests, RS < 100 Ω, RL > 100 kΩ, VOUT = 0 V, and CL ≤ 10 pF. Unless otherwise specified, for ac tests, AV = ±1 V/V, RL = 1 kΩ, and CL ≤ 10 pF. 2/ The limiting terms "min" (minimum) and "max" (maximum) shall be considered to apply to magnitudes only. Negative current shall be defined as conventional current flow out of a device terminal. 3/ This test is guaranteed by testing CMRR. 4/ If not tested, shall be guaranteed to the limits specified in table I herein. 5/ Quiescent power consumption is based on quiescent supply current test maximum (no load at the output). 6/ Slew rate test limits are guarantee after 5 minutes of warm-up. 7/ Full power bandwidth = SR / (2 x π x VPK). 8/ Rise and fall times measured between 10 percent and 90 percent point.
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A 5962-89647 MICROCIRCUIT DRAWING
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 C
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DSCC FORM 2234 APR 97