Datasheet ADuM3190S (Analog Devices) - 7
| Manufacturer | Analog Devices |
| Description | Aerospace High Stability Isolated Error Amplifier |
| Pages / Page | 14 / 7 — 5.0 Burn-In Life Test, and Radiation |
| Revision | C |
| File Format / Size | PDF / 1.1 Mb |
| Document Language | English |
5.0 Burn-In Life Test, and Radiation
Model Line for this Datasheet
Text Version of Document
Table IIA Notes: 1/ PDA applies to Table I subgroup 1 and Table IIB delta parameters. 2/ See Table IIB for delta parameters 3/ Parameters noted in Table IA are not tested post irradiation. 1/ 240 hour burn in and group C end point electrical parameters. 2/ Deltas are performed at room temperature TA = +25°C.
5.0 Burn-In Life Test, and Radiation
5.1. Burn-In Test Circuit, Life Test Circuit 5.1.1. The test conditions and circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 test condition B of MIL –STD-883. 5.1.2. HTRB is not applicable for this drawing. 5.2. Radiation Exposure Circuit 5.2.1. The radiation exposure circuit shall be maintained by the manufacturer under document revision level
5.0 Burn-In Life Test, and Radiation
5.1. Burn-In Test Circuit, Life Test Circuit 5.1.1. The test conditions and circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 test condition B of MIL –STD-883. 5.1.2. HTRB is not applicable for this drawing. 5.2. Radiation Exposure Circuit 5.2.1. The radiation exposure circuit shall be maintained by the manufacturer under document revision level
