Datasheet LT6654BX (Analog Devices) - 3
| Manufacturer | Analog Devices |
| Description | 175°C, Wide Supply 2.5V Precision Voltage Reference |
| Pages / Page | 14 / 3 — ELECTRICAL CHARACTERISTICS. The. denotes the specifications which apply … |
| File Format / Size | PDF / 1.2 Mb |
| Document Language | English |
ELECTRICAL CHARACTERISTICS. The. denotes the specifications which apply over the specified junction
Model Line for this Datasheet
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link to page 2 link to page 7 LT6654BX
ELECTRICAL CHARACTERISTICS The
l
denotes the specifications which apply over the specified junction temperature range, otherwise specifications are at TA = 25°C, CIN = 0.1μF, COUT = 1μF, IOUT = 0A and VIN = VOUT + 0.5V, unless otherwise noted. PARAMETER CONDITIONS MIN TYP MAX UNITS
Output Voltage Accuracy –0.10 0.10 % l –0.43 1.00 % Output Voltage Temperature Coefficient (Note 6) l 10 20 ppm/°C Line Regulation (Note 7) VOUT + 0.5V ≤ VIN ≤ 36V 1.2 5 ppm/V l 30 ppm/V Load Regulation (Note 7) IOUT(SOURCE) = 3mA 3 8 ppm/mA l 50 ppm/mA Load Regulation (Note 7) IOUT(SINK) = 10mA 17 35 ppm/mA l 80 ppm/mA Dropout Voltage (Note 8) VIN – VOUT, ΔVOUT = 0.1% IOUT = 0mA 55 100 mV l 120 mV IOUT(SOURCE) = 3mA l 400 mV IOUT(SINK) = 10mA l 50 mV Supply Current No Load 350 μA l 600 μA Output Short-Circuit Current (Note 9) Short VOUT to GND 40 mA Short VOUT to VIN 30 mA Output Voltage Noise (Note 10) 0.1Hz ≤ f ≤ 10Hz 1. 5 ppmP-P 10Hz ≤ f ≤ 1kHz 2.0 ppmRMS Turn-On Time 0.1% Settling, CLOAD = 1μF 150 μs Long-Term Drift of Output Voltage (Note 11) 50 ppm/√kHr Hysteresis (Note 12) ΔT = –40°C to 125°C 26 ppm ΔT = –40°C to 175°C 30 ppm
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 10:
Peak-to-peak noise is measured with a 1-pole high pass filter may cause permanent damage to the device. Exposure to any Absolute at 0.1Hz and 2-pole low pass filter at 10Hz. The unit is enclosed in a Maximum Rating condition for extended periods may affect device still-air environment to eliminate thermocouple effects on the leads. The reliability and lifetime. test time is 10 seconds. RMS noise is measured on a spectrum analyzer
Note 2:
Product lifetime decreases at very high temperature, predicted by in a shielded environment where the intrinsic noise of the instrument is the Arrhenius equation. removed to determine the actual noise of the device.
Note 3:
By design, the LT6654BX is guaranteed functional over the
Note 11:
Long-term stability typically has a logarithmic characteristic operating junction temperature range of –60°C to 175°C. and therefore, changes after 1000 hours tend to be much smaller than
Note 4:
If the parts are stored outside of the specified temperature range, before that time. Total drift in the second thousand hours is normally less the output may shift due to hysteresis. than one third that of the first thousand hours with a continuing trend toward reduced drift with time. Long-term stability will also be affected by
Note 5:
The stated temperature is typical for soldering of the leads during differential stresses between the IC and the board material created during manual rework. For detailed IR reflow recommendations, refer to the board assembly. Applications Information section.
Note 12:
Hysteresis in output voltage is created by package stress
Note 6:
Temperature coefficient is measured by dividing the maximum that differs depending on whether the IC was previously at a higher or change in output voltage by the specified temperature range of –40°C lower temperature. Output voltage is always measured at 25°C, but to 125°C. For –40°C to 175°C temperature range, the maximum output the IC is cycled to the hot or cold temperature limit before successive voltage accuracy is specified. measurements. Hysteresis measures the maximum output change for the
Note 7:
Line and load regulations are measured on a pulse basis from no averages of three hot or cold temperature cycles. For instruments that load to the specified load current. Output changes due to die temperature are stored at well controlled temperatures (within 20 or 30 degrees of change must be taken into account separately. operational temperature), it is usually not a dominant error source. Typical
Note 8:
Excludes load regulation errors. hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to
Note 9:
LT6654BX does not have thermal protection. 25°C, preconditioned by one thermal cycle. Rev. 0 For more information www.analog.com 3 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Electrical Characteristics Typical Performance Characteristics Pin Functions Block Diagram Applications Information Package Description Typical Application Related Parts
ELECTRICAL CHARACTERISTICS The
l
denotes the specifications which apply over the specified junction temperature range, otherwise specifications are at TA = 25°C, CIN = 0.1μF, COUT = 1μF, IOUT = 0A and VIN = VOUT + 0.5V, unless otherwise noted. PARAMETER CONDITIONS MIN TYP MAX UNITS
Output Voltage Accuracy –0.10 0.10 % l –0.43 1.00 % Output Voltage Temperature Coefficient (Note 6) l 10 20 ppm/°C Line Regulation (Note 7) VOUT + 0.5V ≤ VIN ≤ 36V 1.2 5 ppm/V l 30 ppm/V Load Regulation (Note 7) IOUT(SOURCE) = 3mA 3 8 ppm/mA l 50 ppm/mA Load Regulation (Note 7) IOUT(SINK) = 10mA 17 35 ppm/mA l 80 ppm/mA Dropout Voltage (Note 8) VIN – VOUT, ΔVOUT = 0.1% IOUT = 0mA 55 100 mV l 120 mV IOUT(SOURCE) = 3mA l 400 mV IOUT(SINK) = 10mA l 50 mV Supply Current No Load 350 μA l 600 μA Output Short-Circuit Current (Note 9) Short VOUT to GND 40 mA Short VOUT to VIN 30 mA Output Voltage Noise (Note 10) 0.1Hz ≤ f ≤ 10Hz 1. 5 ppmP-P 10Hz ≤ f ≤ 1kHz 2.0 ppmRMS Turn-On Time 0.1% Settling, CLOAD = 1μF 150 μs Long-Term Drift of Output Voltage (Note 11) 50 ppm/√kHr Hysteresis (Note 12) ΔT = –40°C to 125°C 26 ppm ΔT = –40°C to 175°C 30 ppm
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 10:
Peak-to-peak noise is measured with a 1-pole high pass filter may cause permanent damage to the device. Exposure to any Absolute at 0.1Hz and 2-pole low pass filter at 10Hz. The unit is enclosed in a Maximum Rating condition for extended periods may affect device still-air environment to eliminate thermocouple effects on the leads. The reliability and lifetime. test time is 10 seconds. RMS noise is measured on a spectrum analyzer
Note 2:
Product lifetime decreases at very high temperature, predicted by in a shielded environment where the intrinsic noise of the instrument is the Arrhenius equation. removed to determine the actual noise of the device.
Note 3:
By design, the LT6654BX is guaranteed functional over the
Note 11:
Long-term stability typically has a logarithmic characteristic operating junction temperature range of –60°C to 175°C. and therefore, changes after 1000 hours tend to be much smaller than
Note 4:
If the parts are stored outside of the specified temperature range, before that time. Total drift in the second thousand hours is normally less the output may shift due to hysteresis. than one third that of the first thousand hours with a continuing trend toward reduced drift with time. Long-term stability will also be affected by
Note 5:
The stated temperature is typical for soldering of the leads during differential stresses between the IC and the board material created during manual rework. For detailed IR reflow recommendations, refer to the board assembly. Applications Information section.
Note 12:
Hysteresis in output voltage is created by package stress
Note 6:
Temperature coefficient is measured by dividing the maximum that differs depending on whether the IC was previously at a higher or change in output voltage by the specified temperature range of –40°C lower temperature. Output voltage is always measured at 25°C, but to 125°C. For –40°C to 175°C temperature range, the maximum output the IC is cycled to the hot or cold temperature limit before successive voltage accuracy is specified. measurements. Hysteresis measures the maximum output change for the
Note 7:
Line and load regulations are measured on a pulse basis from no averages of three hot or cold temperature cycles. For instruments that load to the specified load current. Output changes due to die temperature are stored at well controlled temperatures (within 20 or 30 degrees of change must be taken into account separately. operational temperature), it is usually not a dominant error source. Typical
Note 8:
Excludes load regulation errors. hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to
Note 9:
LT6654BX does not have thermal protection. 25°C, preconditioned by one thermal cycle. Rev. 0 For more information www.analog.com 3 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Electrical Characteristics Typical Performance Characteristics Pin Functions Block Diagram Applications Information Package Description Typical Application Related Parts
