AD8305Data Sheet1040008350063000c) 4MEAN + 3σV/de25002mIFT ( 0UNT 2000RCOy D –21500VMEAN – 3σΔ –41000–6–8500–100–40 –30 –20 –100102030405060708090 030 027 0.40.60.81.01.21.41.6TEMPERATURE (°C)INTERCEPT (nA) 03053- 03053- Figure 27. Slope Drift vs. Temperature (3σ to Either Side of Mean of Figure 30. Distribution of Logarithmic Intercept (Nominally 1 nA when 200 mV/decade) RREF = 200 kΩ ± 0.1%) Sample >22,000 35070002506000MEAN + 3σ1505000) pA504000IFT ( RUNTD –50CO 3000Iz Δ–1502000MEAN – 3σ–2501000–3500–40 –30 –20 –100102030405060708090 028 2.442.462.482.502.522.542.56 031 85TEMPERATURE (°C)V 03053- REF (V) 03053- Figure 28. Intercept Drift vs. Temperature (3σ to Either Side of Mean of 1 nA) Figure 31. Distribution of VREF (RL = 100 kΩ) Sample >22,000 600060005000500040004000UNT 3000UNT 3000COCO200020001000100000190195200205210 029 –0.015–0.010–0.00500.0050.0100.015 032 SLOPE (mV/dec) 03053- VINPT – VSUM VOLTAGE (V) 03053- Figure 29. Distribution of Logarithmic Slope (Nominally Figure 32. Distribution of Offset Voltage (VINPT − VSUM) Sample >22,000 200 mV/decade) Sample >22,000 Rev. C | Page 10 of 24 Document Outline Features Applications Functional Block Diagram General Description Table of Contents Revision History Specifications Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics General Structure Theory Managing Intercept and Slope Response Time and Noise Considerations Power Supply Sequencing Applications Information Calibration Using a Negative Supply Log-Ratio Applications Reversing The Input Polarity Characterization Methods Evaluation Board Outline Dimensions Ordering Guide